TXC-06101AILQ Transwitch Corporation, TXC-06101AILQ Datasheet - Page 185

• Manufacturer Part Number: TXC-06101AILQ
• Manufacturer: Transwitch Corporation

Specifications of TXC-06101AILQ

• Operating Temperature (min): -40C
• Operating Temperature Classification: Industrial
• Operating Temperature (max): 85C
• Package Type: PQFP
• Rad Hardened: No
• Lead Free Status / Rohs Status: Not Compliant

BYPASS Test Instruction:
When the BYPASS instruction is shifted in, the PHAST-1 device remains fully operational. While in this test
mode, a scan operation will transfer serial data from the TDI input, through an internal scan cell, to the TDO
pin. The purpose of this instruction is to abbreviate the scan path through the circuits that are not being tested
to only a single clock delay.
Boundary Scan Reset
Specific control of the TRESI pin is required in order to ensure that the boundary scan logic does not interfere
with normal device operation. This pin should be held low whenever boundary scan operations are not being
performed. Placing a pull down resistor from TRESI pin to ground, which can allow a tester to drive the TRESI
pin high, is suggested when the boundary scan testing feature is used.
Boundary Scan Description Language (BSDL) File
The PHAST-1 BSDL file is available on the "Products" page of the TranSwitch Web site (www.transwitch.com).
Proprietary TranSwitch Corporation Information for use Solely by its Customers
Figure 79. Boundary Scan Schematic
TDI
Boundary Scan Register
Instruction Register
Test Data Registers
IN
TCKI TMSI
TAP Controller
Serial Test Data
Boundary Scan
Control Pins
PHAST-1
DEVICE
LOGIC
CORE
OF
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TRESI
DATA SHEET
OUT
TDO
Signal input and
output pins
TXC-06101
Ed. 3, April 2001
TXC-06101-MB
PHAST-1