ATmega64 Atmel Corporation, ATmega64 Datasheet - Page 380

• Manufacturer Part Number: ATmega64
• Manufacturer: Atmel Corporation

Specifications of ATmega64

• Flash (kbytes): 64 Kbytes
• Pin Count: 64
• Max. Operating Frequency: 16 MHz
• Cpu: 8-bit AVR
• # Of Touch Channels: 16
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 53
• Ext Interrupts: 8
• Usb Speed: No
• Usb Interface: No
• Spi: 1
• Twi (i2c): 1
• Uart: 2
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: No
• Adc Channels: 8
• Adc Resolution (bits): 10
• Adc Speed (ksps): 15
• Analog Comparators: 1
• Resistive Touch Screen: No
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 4
• Eeprom (bytes): 2048
• Self Program Memory: YES
• Dram Memory: No
• Nand Interface: No
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 2.7 to 5.5
• Operating Voltage (vcc): 2.7 to 5.5
• Fpu: No
• Mpu / Mmu: no / no
• Timers: 4
• Output Compare Channels: 8
• Input Capture Channels: 2
• Pwm Channels: 7
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: Yes

2490Q–AVR–06/10
4. Stabilizing time needed when changing OSCCAL Register
5. IDCODE masks data from TDI input
6. Reading EEPROM by using ST or STS to set EERE bit triggers unexpected interrupt
After increasing the source clock frequency more than 2% with settings in the OSCCAL reg-
ister, the device may execute some of the subsequent instructions incorrectly.
Problem Fix / Workaround
The behavior follows errata number 3., and the same Fix / Workaround is applicable on this
errata.
The JTAG instruction IDCODE is not working correctly. Data to succeeding devices are
replaced by all-ones during Update-DR.
Problem Fix / Workaround
–
–
–
request.
Reading EEPROM by using the ST or STS command to set the EERE bit in the EECR reg-
ister triggers an unexpected EEPROM interrupt request.
Problem Fix / Workaround
Always use OUT or SBI to set EERE in EECR.
If ATmega64 is the only device in the scan chain, the problem is not visible.
Select the Device ID Register of the ATmega64 by issuing the IDCODE instruction or
by entering the Test-Logic-Reset state of the TAP controller to read out the contents
of its Device ID Register and possibly data from succeeding devices of the scan
chain. Issue the BYPASS instruction to the ATmega64 while reading the Device ID
Registers of preceding devices of the boundary scan chain.
If the Device IDs of all devices in the boundary scan chain must be captured
simultaneously, the ATmega64 must be the first device in the chain.
ATmega64(L)
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