NX3008CBKV NXP Semiconductors, NX3008CBKV Datasheet - Page 15

Complementary N/P-channel enhancement mode Field-Effect Transistor (FET) in an ultra small and flat lead SOT666 Surface-Mounted Device (SMD) plastic package using Trench MOSFET technology

NX3008CBKV

Manufacturer Part Number
NX3008CBKV
Description
Complementary N/P-channel enhancement mode Field-Effect Transistor (FET) in an ultra small and flat lead SOT666 Surface-Mounted Device (SMD) plastic package using Trench MOSFET technology
Manufacturer
NXP Semiconductors
Datasheet
NXP Semiconductors
8. Test information
NX3008CBKV
Product data sheet
Fig 29. Gate charge waveform definitions
Fig 31. Duty cycle definition
V
V
V
V
GS(pl)
DS
GS(th)
GS
8.1 Quality information
Q
GS1
I
Q
D
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is
suitable for use in automotive applications.
GS
Q
GS2
Q
G(tot)
Q
GD
All information provided in this document is subject to legal disclaimers.
003aaa508
P
Rev. 1 — 29 July 2011
t
1
t
2
30 / 30 V, 400 / 220 mA N/P-channel Trench MOSFET
duty cycle δ =
Fig 30. TR2: Source current as a function of
(A)
-0.25
-0.20
-0.15
-0.10
-0.05
I
0.00
S
006aaa812
0.0
source-drain voltage; typical values
V
(1) T
(2) T
GS
t
t
t
1
2
= 0 V
j
j
= 150 °C
= 25 °C
-0.4
NX3008CBKV
(1)
-0.8
(2)
V
© NXP B.V. 2011. All rights reserved.
SD
001aao265
(V)
-1.2
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