FDMC8554 Fairchild Semiconductor, FDMC8554 Datasheet
FDMC8554
Specifications of FDMC8554
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FDMC8554 Summary of contents
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... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...
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Change From Change To Results/Discussion Test: (Autoclave) Lot Device Q20070296BAACLV FDMC2674 Q20070296CAACLV FDMC8854 Test: (High Temperature Gate Bias) Lot Device Q20070296BAHTGB FDMC2674 Q20070296BAHTGB FDMC2674 Q20070296CAHTGB FDMC8854 Q20070296CAHTGB FDMC8854 Test: (High Temperature Reverse Bias) Lot Device Q20070296BAHTRB FDMC2674 Q20070296BAHTRB FDMC2674 Q20070296CAHTRB ...
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... For a complete listing of products covered in this PCN release, please refer to the affected FSID listing. Affected FSIDs : FDM3300NZ FDM3622_NL FDMC2523P FDMC3300NZA FDMC8854 0/77 0/77 0/77 0/77 0/77 0/77 264-HOURS 0/77 0/77 0/77 Results 0/154 0/231 0/231 FDM3300NZ_NL FDM6296 FDMC2610 FDMC5614P FDMC8878 Failure Code Failure Code FDM3622 FDM6296_NL FDMC2674 FDMC8554 FDMC8878_NBSE003 Pg. 3 ...