BLF4G22S-100,112 NXP Semiconductors, BLF4G22S-100,112 Datasheet - Page 7

BASESTATION FINAL 2.2GHZ SOT502B

BLF4G22S-100,112

Manufacturer Part Number
BLF4G22S-100,112
Description
BASESTATION FINAL 2.2GHZ SOT502B
Manufacturer
NXP Semiconductors
Datasheet

Specifications of BLF4G22S-100,112

Package / Case
SOT502B
Transistor Type
LDMOS
Frequency
2.11GHz
Gain
13.5dB
Voltage - Rated
65V
Current Rating
12A
Current - Test
900mA
Voltage - Test
28V
Power - Output
25W
Configuration
Single
Transistor Polarity
N-Channel
Resistance Drain-source Rds (on)
0.09 Ohms
Drain-source Breakdown Voltage
65 V
Gate-source Breakdown Voltage
15 V
Continuous Drain Current
12 A
Maximum Operating Temperature
+ 200 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 65 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Noise Figure
-
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
568-2399
934058168112
BLF4G22S-100
BLF4G22S-100
Fig 7. Component layout for 2.14 GHz test circuit
The components are situated on double copper-clad Taconic RF35 Printed-Circuit Board (PCB) (
The other side is unetched and serves as a ground plane.
See
Table 10
75 mm
for list of components.
V
L1
G
C1
50 mm
R1
C3
C2
C7
L2
L3
L4
C5
C4
C6
L5
L7
L6
L8
L14
C12
r
C8 C9 C10
= 3.5); thickness = 0.76 mm.
L9
C11
L10
C13
C16
C14
C15
L11
L12
L13
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