MT45W2MW16BGB-701 IT Micron Technology Inc, MT45W2MW16BGB-701 IT Datasheet - Page 19

MT45W2MW16BGB-701 IT

Manufacturer Part Number
MT45W2MW16BGB-701 IT
Description
Manufacturer
Micron Technology Inc
Datasheet

Specifications of MT45W2MW16BGB-701 IT

Operating Temperature (max)
85C
Operating Temperature (min)
-40C
Mounting
Surface Mount
Operating Temperature Classification
Industrial
Lead Free Status / RoHS Status
Compliant
Low-Power Operation
Standby Mode Operation
Temperature-Compensated Refresh
Partial-Array Refresh
Deep Power-Down Operation
PDF: 09005aef82832fa2/Source: 09005aef82832f5f
32mb_burst_cr1_0_p24z_2.fm - Rev. E 9/08 EN
During standby, the device current consumption is reduced to the level necessary to
perform the DRAM REFRESH operation. Standby operation occurs when CE# is HIGH.
The device will enter a reduced power state upon completion of a READ or WRITE oper-
ation or when the address and control inputs remain static for an extended period of
time. This mode will continue until a change occurs to the address or control inputs.
Temperature-compensated refresh (TCR) allows for adequate refresh at different
temperatures. This CellularRAM device includes an on-chip temperature sensor that
continually adjusts the refresh rate according to the operating temperature.
Partial-array refresh (PAR) restricts REFRESH operation to a portion of the total memory
array. This feature enables the device to reduce standby current by refreshing only that
part of the memory array required by the host system. The refresh options are full array,
one-half array, one-quarter array, one-eighth array, or none of the array. The mapping
of these partitions either can start at the beginning or the end of the address map (see
Table 6 on page 32). READ and WRITE operations to address ranges receiving refresh
will not be affected. Data stored in addresses not receiving refresh will become
corrupted. When reenabling additional portions of the array, the new portions are avail-
able immediately upon writing to the RCR.
Deep power-down (DPD) operation disables all refresh-related activity. This mode is
used if the system does not require the storage provided by the CellularRAM device. Any
stored data will become corrupted when DPD is enabled. When refresh activity has been
reenabled by rewriting the RCR, the CellularRAM device will require 150µs to perform an
initialization procedure before normal operations can resume. During this 150µs period,
the current consumption will be higher than the specified standby levels, but consider-
ably lower than the active current specification.
DPD cannot be enabled or disabled by writing to the RCR using the software access
sequence; the RCR should be accessed using CRE instead.
32Mb: 2 Meg x 16 Async/Page/Burst CellularRAM 1.0 Memory
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Micron Technology, Inc., reserves the right to change products or specifications without notice.
Low-Power Operation
©2007 Micron Technology, Inc. All rights reserved.

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