EP2S15F484C3N Altera, EP2S15F484C3N Datasheet - Page 214

IC STRATIX II FPGA 15K 484-FBGA

EP2S15F484C3N

Manufacturer Part Number
EP2S15F484C3N
Description
IC STRATIX II FPGA 15K 484-FBGA
Manufacturer
Altera
Series
Stratix® IIr
Datasheet

Specifications of EP2S15F484C3N

Number Of Logic Elements/cells
15600
Number Of Labs/clbs
780
Total Ram Bits
419328
Number Of I /o
342
Voltage - Supply
1.15 V ~ 1.25 V
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 85°C
Package / Case
484-FBGA
Family Type
Stratix II
No. Of I/o's
342
I/o Supply Voltage
3.3V
Operating Frequency Max
550MHz
Operating Temperature Range
0°C To +85°C
Logic Case Style
BGA
No. Of Pins
484
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Number Of Gates
-
Other names
544-1874
EP2S15F484C3N

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Duty Cycle Distortion
Figure 5–8. DCD Measurement Technique for Non-DDIO (Single-Data Rate) Outputs
5–78
Stratix II Device Handbook, Volume 1
clk
INPUT
VCC
Figure 5–7. Duty Cycle Distortion
DCD expressed in absolution derivation, for example, D1 or D2 in
Figure
percentage, and the percentage number is clock-period dependent. DCD
as a percentage is defined as
DCD Measurement Techniques
DCD is measured at an FPGA output pin driven by registers inside the
corresponding I/O element (IOE) block. When the output is a single data
rate signal (non-DDIO), only one edge of the register input clock (positive
or negative) triggers output transitions
present on the input clock signal or caused by the clock input buffer or
different input I/O standard does not transfer to the output signal.
IOE
(T/2 – D1) / T (the low percentage boundary)
(T/2 + D2) / T (the high percentage boundary)
5–7, is clock-period independent. DCD can also be expressed as a
NOT
inst1
CLKH = T/2
Falling Edge A
DFF
inst
Ideal Falling Edge
Clock Period (T)
D
CLRN
PRN
D1
Q
D2
(Figure
Falling Edge B
CLKL = T/2
5–8). Therefore, any DCD
OUTPUT
Altera Corporation
output
April 2011

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