NDS332P_NL Fairchild Semiconductor, NDS332P_NL Datasheet

NDS332P_NL

Manufacturer Part Number
NDS332P_NL
Description
Manufacturer
Fairchild Semiconductor
Type
Power MOSFETr
Datasheet

Specifications of NDS332P_NL

Number Of Elements
1
Polarity
P
Channel Mode
Enhancement
Drain-source On-res
0.3Ohm
Drain-source On-volt
20V
Gate-source Voltage (max)
±8V
Continuous Drain Current
1A
Power Dissipation
500mW
Operating Temp Range
-55C to 150C
Operating Temperature Classification
Military
Mounting
Surface Mount
Pin Count
3
Package Type
SuperSOT
Lead Free Status / Rohs Status
Compliant

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Asolute Maximum Ratings
Symbol
V
V
I
P
T
THERMAL CHARACTERISTICS
R
R
________________________________________________________________________________
© 1997 Fairchild Semiconductor Corporation
D
NDS332P
P-Channel Logic Level Enhancement Mode Field Effect Transistor
General Description
DSS
GSS
D
J
These P-Channel logic level enhancement mode power field
effect transistors are produced using Fairchild's proprietary, high
cell density, DMOS technology. This very high density process is
especially tailored to minimize on-state resistance. These
devices are particularly suited for low voltage applications such as
notebook computer power management, portable electronics,
and other battery powered circuits where fast
switching, and low in-line power loss are needed in a very small
outline surface mount package.
,T
JA
JC
STG
Parameter
Drain-Source Voltage
Gate-Source Voltage - Continuous
Drain Current - Continuous
Maximum Power Dissipation
Operating and Storage Temperature Range
Thermal Resistance, Junction-to-Ambient
Thermal Resistance, Junction-to-Case
- Pulsed
T
A
= 25°C unless otherwise noted
(Note 1b)
(Note 1a)
(Note 1)
(Note 1a)
(Note 1a)
high-side
Features
-1 A, -20 V, R
Very low level gate drive requirements allowing direct
operation in 3V circuits. V
Proprietary package design using copper lead frame for
superior thermal and electrical capabilities.
High density cell design for extremely low R
Exceptional on-resistance and maximum DC current
capability.
Compact industry standard SOT-23 surface Mount
package.
R
NDS332P
-55 to 150
DS(ON)
DS(ON)
G
0.46
250
-20
-10
0.5
±8
75
-1
= 0.3
= 0.41
GS(th)
D
@ V
@ V
< 1.0V.
GS
GS
= -4.5 V.
S
= -2.7 V
DS(ON)
June 1997
NDS332P Rev. E
.
Units
°C/W
°C/W
°C
W
V
V
A

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NDS332P_NL Summary of contents

Page 1

... THERMAL CHARACTERISTICS R Thermal Resistance, Junction-to-Ambient JA R Thermal Resistance, Junction-to-Case JC © 1997 Fairchild Semiconductor Corporation Features - Very low level gate drive requirements allowing direct operation in 3V circuits. V Proprietary package design using copper lead frame for high-side superior thermal and electrical capabilities. ...

Page 2

Electrical Characteristics (T = 25°C unless otherwise noted) A Symbol Parameter OFF CHARACTERISTICS BV Drain-Source Breakdown Voltage DSS I Zero Gate Voltage Drain Current DSS I Current Gate - Body Leakage GSS I Current Gate - Body Leakage GSS ON ...

Page 3

Electrical Characteristics (T = 25°C unless otherwise noted) A Symbol Parameter DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS I Maximum Continuous Source Current S Drain-Source Diode Forward Voltage V SD Notes the sum of the junction-to-case and case-to-ambient ...

Page 4

Typical Electrical Characteristics -2 -4.5V GS -2.5 -3.5 -3.0 -2.7 -2 -2.0 -1 -0 DRAIN-SOURCE VOLTAGE (V) DS Figure 1. On-Region Characteristics 1 -1A D 1.6 V ...

Page 5

Typical Electrical Characteristics 1. -250µA D 1.08 1.04 1 0.96 0.92 -50 - JUNCTION TEMPERATURE (°C) J Figure 7. Breakdown Voltage Variation with . Temperature 500 300 200 100 ...

Page 6

Typical Electrical Characteristics -55° -0 DRAIN CURRENT (A) D Figure 13. Transconductance Variation with Drain Current and Temperature 1 0.8 0 ...

Page 7

... TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended exhaustive list of all such trademarks. ACEx™ FAST Bottomless™ FASTr™ FRFET™ CoolFET™ GlobalOptoisolator™ CROSSVOLT™ GTO™ DenseTrench™ ...

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