km416rd8ac Samsung Semiconductor, Inc., km416rd8ac Datasheet - Page 34

• Manufacturer Part Number: km416rd8ac
• Description: 128/144mbit Rdram 256k X 16/18 Bit X 2*16 Dependent Banks Direct Rdramtm
• Manufacturer: Samsung Semiconductor, Inc.

KM416RD8AC(D)/KM418RD8AC(D)
. .
SA11..SA0
045
046
047
048
049
04a
04b
04c
04d
04e
04f
080
16
16
16
16
16
16
16
16
16
16
16
16
- 0ff
16
Register
NAPX
PDNXA
PDNX
TPARM
TFRM
TCDLY1
SKIP
TCYCLE
TEST77
TEST78
TEST79
reserved
Field
NAPXA
NAPX
DQS
PDNXA
PDNX
TCAS
TCLS
TCDLY0
TFRM
TCDLY1
AS
MSE
MS
TCYCLE
TEST77
TEST78
TEST79
reserved
read-write/ read-only
read-write, 5 bits
read-write, 5 bits
read-write, 1 bits
read-write, 13 bits
read-write, 13 bits
read-write, 2 bits
read-write, 2 bits
read-write, 3 bits
read-write, 4 bits
read-write, 3 bits
read, 1 bit
read-write, 1 bit
read-write, 1 bit
read-write, 14 bits
read-write, 16 bits
read-write, 16 bits
read-write, 16 bits
vendor-specific
Table 16: Control Register Summary
Page 31
Description
NAP exit. Specifies length of NAP exit phase A.
NAP exit. Specifies length of NAP exit phase A + phase B.
DQ select. Selects CMD framing for NAP/PDN exit.
PDN exit. Specifies length of PDN exit phase A.
PDN exit. Specifies length of PDN exit phase A + phase B.
t
t
t
t
t
Auto Skip value established by the SETF command.
Manual Skip Enable. Allows the MS value to override the AS value.
Manual Skip value.
t
Test register. Write with zero after SIO reset.
Test register. Do not read or write after SIO reset.
Test register. Do not read or write after SIO reset.
Vendor-specific test registers. Do not read or write after SIO reset.
CAS-C
CLS-C
CDLY0-C
FRM-C
CDLY1-C
CYCLE
core parameter. Determines t
core parameter. Determines t
core parameter. Determines ROW-COL packet framing interval.
datasheet parameter. Specifies cycle time in 64ps units.
core parameter. Programmable delay for read data.
core parameter. Programmable delay for read data.
CAC
OFFP
and t
datasheet parameter.
Rev. 1.01 Oct. 1999
Direct RDRAM
OFFP
parameters.
™