ppc405exr Applied Micro Circuits Corporation (AMCC), ppc405exr Datasheet - Page 51

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ppc405exr

Manufacturer Part Number
ppc405exr
Description
Powerpc 405exr Embedded Processor
Manufacturer
Applied Micro Circuits Corporation (AMCC)
Datasheet

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PPC405EXr – PowerPC 405EXr Embedded Processor
Table 10. Recommended DC Operating Conditions (Sheet 2 of 2)
Device operation beyond the conditions specified is not recommended. Extended operation beyond the recommended
conditions can affect device reliability.
Power Supply Sequence
All the PPC405EXr I/O designs are power supply sequence independent. There is no requirement that the power
supplies power up in any particular order. The following items are power sequence considerations:
AMCC Proprietary
I/O Maximum Allowable Overshoot
(3.3V LVTTL and 2.5V/3.3 tolerant CMOS)
I/O Maximum Allowable Undershoot
(3.3V LVTTL and 2.5V/3.3 tolerant CMOS)
Case Temperature
Notes:
• If the logic power (V
• If the I/O power is applied before the logic power is applied, the output driver output stage (connected to the
• External voltage should not be applied to the chip I/O balls before the associated I/O power supply voltage is
• A chip power down cycle must complete (all I/O supply voltages and V
• During a 405EX power-up cycle, the system reset and test reset inputs should be asserted low. System reset
1. LPDL is least positive down level; MPUL is most positive up level.
2. Can be extended to 1.1V min., 1.2V typ., 1.3V max. with an estimated power increase of 130mW at 1.2V nom.
3. Maximum duration is 10% of the bus clock period. Bus clock is as follows:
4. Duration of the overshoot is time above V
5. A 533MHz part running at 400MHz or less can operate up to a case temperature of +95°C.
circuitry that ensures the output of the receiver connected to internal chip logic is 0 until the I/O power is
applied. When the logic power supply is on and the I/O power supplies are off, the I/O logic connected to the
associated ball neither sinks or sources significant current unless influenced by an internal pull-up or pull-down
resistor. While the I/O supply is ramping, the state of the I/O balls are not predictable. This power sequence is
not destructive to the I/Os or internal logic and does not cause any functional problems.
balls) will come up in an unknown state (driving 1, driving 0, or tri-state) until the internal logic voltage is stable
within normal operating range. This power sequence is not destructive to the I/Os or internal logic and does not
cause any functional problems.
applied to the chip.
power-up cycle is started.
and test reset should remain asserted until the system clock is stable and then at least 32 system clock times
after all power supplies are stable within normal operating range. Failure to follow this reset sequence during
the power-up cycle might result in unpredictable operation.
EBC—PerClk
Ethernet—RxClk
USB—USB2Clk
Parameter
DD
) is applied before the I/O supply voltages, the I/Os include internal supply sequencing
IH
max. Duration of the undershoot is time below V
Symbol
V
V
MAO
T
MAU
C
Minimum
−0.6
−40
Typical
DD
are below +0.4V) before a new
IL
Preliminary Data Sheet
min.
Maximum
Revision 1.10 - July 10, 2008
+3.9
+85
Unit
°C
V
V
Notes
3, 4
3,4
5
51

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