DF3026X25V Renesas Electronics America, DF3026X25V Datasheet - Page 607
![MCU 3V 256K PB-FREE 100-TQFP](/photos/28/61/286123/100-tqfp__100-vqfp_sml.jpg)
DF3026X25V
Manufacturer Part Number
DF3026X25V
Description
MCU 3V 256K PB-FREE 100-TQFP
Manufacturer
Renesas Electronics America
Series
H8® H8/300Hr
Specifications of DF3026X25V
Core Processor
H8/300H
Core Size
16-Bit
Speed
25MHz
Connectivity
SCI, SmartCard
Peripherals
PWM, WDT
Number Of I /o
70
Program Memory Size
256KB (256K x 8)
Program Memory Type
FLASH
Ram Size
8K x 8
Voltage - Supply (vcc/vdd)
3 V ~ 3.6 V
Data Converters
A/D 8x10b; D/A 2x8b
Oscillator Type
Internal
Operating Temperature
-20°C ~ 75°C
Package / Case
100-TQFP, 100-VQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
DF3026X25V
Manufacturer:
Renesas Electronics America
Quantity:
10 000
- Current page: 607 of 843
- Download datasheet (5Mb)
18.7.3
In error protection, an error is detected when MCU runaway occurs during flash memory
programming/erasing *
algorithm, and the program/erase operation is aborted. Aborting the program/erase operation
prevents damage to the flash memory due to overprogramming or overerasing.
If the MCU malfunctions during flash memory programming/erasing, the FLER bit is set to 1 in
the flash memory status register (FLMSR2) and the error protection state is entered. FLMCR1,
FLMCR2, and EBR settings *
point at which the error occurred. Program mode or erase mode cannot be re-entered by re-setting
the P or E bit in FLMCR. However, PV and EV bit setting is enabled, and a transition can be made
to verify mode *
FLER bit setting conditions are as follows:
1. When flash memory is read during programming/erasing (including a vector read or instruction
2. Immediately after the start of exception handling during programming/erasing (excluding
3. When a SLEEP instruction (including software standby) is executed during
4. When the bus is released during programming/erasing
Notes: 1. State in which the P bit or E bit in FLMCR1 is set to 1. Note that NMI input is disabled
Figure 18.13 shows the flash memory state transition diagram.
fetch)
reset, illegal instruction, trap instruction, and division-by-zero exception handling)
programming/erasing
Error protection is released only by a
2. It is possible to perform a program-verify operation on the 128 bytes being
3. FLMCR1 and EBR can be written to. However, the registers are initialized if a
Error Protection
in this state.
programmed, or an erase-verify on the block being erased.
transition is made to software standby mode while in the error protection state.
2
.
1
, or operation is not performed in accordance with the program/erase
3
are retained, but program mode or erase mode is aborted at the
R E S
Section 18 Flash Memory [H8/3024F-ZTAT Version]
pin or WDT reset, or in hardware standby mode.
Rev. 2.00 Sep 20, 2005 page 567 of 800
REJ09B0260-0200
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