LH28F320SKTD-ZR Sharp Microelectronics, LH28F320SKTD-ZR Datasheet - Page 39

• Manufacturer Part Number: LH28F320SKTD-ZR
• Description: IC FLASH 32MBIT 70NS 48TSOP
• Manufacturer: Sharp Microelectronics

Specifications of LH28F320SKTD-ZR

• Format - Memory: FLASH
• Memory Type: FLASH
• Memory Size: 32M (4Mx8, 2Mx16)
• Speed: 70ns
• Interface: Parallel
• Voltage - Supply: 2.7 V ~ 3.6 V, 4.5 V ~ 5.5 V
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 48-TSOP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: 425-2463; LHF32KZR

6.2.2 AC INPUT/OUTPUT TEST CONDITIONS
Figure 17. Transient Equivalent Testing
Figure 15. Transient Input/Output Reference Waveform for V
DEVICE
UNDER
TEST
Input rise and fall times (10% to 90%) <10 ns.
Input rise and fall times (10% to 90%) <10 ns.
Input rise and fall times (10% to 90%) <10 ns.
AC test inputs are driven at 2.7V for a Logic "1" and 0.0V for a Logic "0." Input timing begins, and output timing ends, at 1.35V.
AC test inputs are driven at 3.0V for a Logic "1" and 0.0V for a Logic "0." Input timing begins, and output timing ends, at 1.5V.
AC test inputs are driven at 3.0V for a Logic "1" and 0.0V for a Logic "0." Input timing begins, and output timing ends, at 1.5V.
2.7
0.0
3.0
0.0
3.0
0.0
C
L
Capacitance
Includes Jig
Figure 14. Transient Input/Output Reference Waveform for V
Figure 16. Transient Input/Output Reference Waveform for V
Load Circuit
INPUT
INPUT
INPUT
1.3V
R
C
L
1N914
=3.3kΩ
L
1.35
1.5
1.5
(High Speed Testing Configuration)
(Standard Testing Configuration)
OUT
LHF32KZR
TEST POINTS
TEST POINTS
TEST POINTS
Test Configuration Capacitance Loading Value
V
V
V
CC
CC
CC
Test Configuration
=3.3V±0.3V, 2.7V-3.6V
=5V±0.25V
=5V±0.5V
CC
=3.3V±0.3V and V
CC
CC
=2.7V-3.6V
1.35
=5V±0.5V
1.5
1.5
OUTPUT
OUTPUT
CC
OUTPUT
=5V±0.25V
C
L
50
30
50
(pF)
36