LH28F320SKTD-ZR Sharp Microelectronics, LH28F320SKTD-ZR Datasheet - Page 39
![no-image](/images/manufacturer_photos/0/6/603/sharp_microelectronics_sml.jpg)
LH28F320SKTD-ZR
Manufacturer Part Number
LH28F320SKTD-ZR
Description
IC FLASH 32MBIT 70NS 48TSOP
Manufacturer
Sharp Microelectronics
Datasheet
1.LH28F320SKTD-ZR.pdf
(70 pages)
Specifications of LH28F320SKTD-ZR
Format - Memory
FLASH
Memory Type
FLASH
Memory Size
32M (4Mx8, 2Mx16)
Speed
70ns
Interface
Parallel
Voltage - Supply
2.7 V ~ 3.6 V, 4.5 V ~ 5.5 V
Operating Temperature
0°C ~ 70°C
Package / Case
48-TSOP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
425-2463
LHF32KZR
LHF32KZR
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6.2.2 AC INPUT/OUTPUT TEST CONDITIONS
Figure 17. Transient Equivalent Testing
Figure 15. Transient Input/Output Reference Waveform for V
DEVICE
UNDER
TEST
Input rise and fall times (10% to 90%) <10 ns.
Input rise and fall times (10% to 90%) <10 ns.
Input rise and fall times (10% to 90%) <10 ns.
AC test inputs are driven at 2.7V for a Logic "1" and 0.0V for a Logic "0." Input timing begins, and output timing ends, at 1.35V.
AC test inputs are driven at 3.0V for a Logic "1" and 0.0V for a Logic "0." Input timing begins, and output timing ends, at 1.5V.
AC test inputs are driven at 3.0V for a Logic "1" and 0.0V for a Logic "0." Input timing begins, and output timing ends, at 1.5V.
2.7
0.0
3.0
0.0
3.0
0.0
C
L
Capacitance
Includes Jig
Figure 14. Transient Input/Output Reference Waveform for V
Figure 16. Transient Input/Output Reference Waveform for V
Load Circuit
INPUT
INPUT
INPUT
1.3V
R
C
L
1N914
=3.3kΩ
L
1.35
1.5
1.5
(High Speed Testing Configuration)
(Standard Testing Configuration)
OUT
LHF32KZR
TEST POINTS
TEST POINTS
TEST POINTS
Test Configuration Capacitance Loading Value
V
V
V
CC
CC
CC
Test Configuration
=3.3V±0.3V, 2.7V-3.6V
=5V±0.25V
=5V±0.5V
CC
=3.3V±0.3V and V
CC
CC
=2.7V-3.6V
1.35
=5V±0.5V
1.5
1.5
OUTPUT
OUTPUT
CC
OUTPUT
=5V±0.25V
C
L
50
30
50
(pF)
36
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