ST72C215G2M6 STMicroelectronics, ST72C215G2M6 Datasheet - Page 113

IC MCU 8BIT 8K FLASH SOIC-28

ST72C215G2M6

Manufacturer Part Number
ST72C215G2M6
Description
IC MCU 8BIT 8K FLASH SOIC-28
Manufacturer
STMicroelectronics
Series
ST7r
Datasheets

Specifications of ST72C215G2M6

Core Processor
ST7
Core Size
8-Bit
Speed
16MHz
Connectivity
SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
22
Program Memory Size
8KB (8K x 8)
Program Memory Type
FLASH
Ram Size
256 x 8
Voltage - Supply (vcc/vdd)
3.2 V ~ 5.5 V
Data Converters
A/D 6x8b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
28-SOIC (7.5mm Width)
Controller Family/series
ST7
No. Of I/o's
22
Ram Memory Size
256Byte
Cpu Speed
8MHz
No. Of Timers
2
Rohs Compliant
Yes
Processor Series
ST72C2x
Core
ST7
Data Bus Width
8 bit
Data Ram Size
256 B
Interface Type
SPI
Maximum Clock Frequency
16 MHz
Number Of Programmable I/os
22
Number Of Timers
3 bit
Operating Supply Voltage
3.2 V to 5.5 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Development Tools By Supplier
ST7MDT1-DVP2/US
Minimum Operating Temperature
- 40 C
On-chip Adc
8 bit
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
In Transition

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14.7 EMC CHARACTERISTICS
Susceptibility tests are performed on a sample ba-
sis during product characterization.
14.7.1 Functional EMS
(Electro Magnetic Susceptibility)
Based on a simple running application on the
product (toggling 2 LEDs through I/O ports), the
product is stressed by two electro magnetic events
until a failure occurs (indicated by the LEDs).
Figure 70. EMC Recommended star network power supply connection
Notes:
1. Data based on characterization results, not tested in production.
2. The suggested
performance tradeoff. They have to be put as close as possible to the device power supply pins. Other EMC recommen-
dations are given in other sections (I/Os, RESET, OSCx pin characteristics).
Symbol
V
V
FESD
FFTB
POWER
SUPPLY
SOURCE
Voltage limits to be applied on any I/O pin
to induce a functional disturbance
Fast transient voltage burst limits to be ap-
plied through 100pF on V
to induce a functional disturbance
and 0.1 F decoupling capacitors on the power supply lines are proposed as a good price vs. EMC
V
DD
Parameter
DD
ST7
DIGITAL NOISE
FILTERING
and V
DD
pins
EXTERNAL
NOISE
FILTERING
10 F
V
conforms to IEC 1000-4-2
V
conforms to IEC 1000-4-4
ST72104G, ST72215G, ST72216G, ST72254G
DD
DD
0.1 F
A device reset allows normal operations to be re-
sumed.
5V, T
5V, T
0.1 F
ESD: Electro-Static Discharge (positive and
negative) is applied on all pins of the device until
a functional disturbance occurs. This test
conforms with the IEC 1000-4-2 standard.
FTB: A Burst of Fast Transient voltage (positive
and negative) is applied to V
a 100pF capacitor, until a functional disturbance
occurs. This test conforms with the IEC 1000-4-
4 standard.
Conditions
A
A
+25°C, f
+25°C, f
V
V
V
V
DD
SS
SSA
DDA
OSC
OSC
ST72XXX
8MHz
8MHz
2)
Neg
-1
-4
DD
1)
and V
Pos
1
4
SS
1)
through
113/140
Unit
kV

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