AD962711-105EBZ Analog Devices Inc, AD962711-105EBZ Datasheet - Page 36

• Manufacturer Part Number: AD962711-105EBZ
• Description: EVAL For 11bit 105 Dual 1.8V
• Manufacturer: Analog Devices Inc

Specifications of AD962711-105EBZ

• Number Of Adc's: 2
• Number Of Bits: 11
• Sampling Rate (per Second): 105M
• Data Interface: Serial
• Inputs Per Adc: 1 Differential
• Input Range: 1 ~ 2 Vpp
• Power (typ) @ Conditions: 600mW @ 105MSPS
• Voltage Supply Source: Analog and Digital
• Operating Temperature: -40°C ~ 85°C
• Utilized Ic / Part: AD962711
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

AD9627-11
BUILT-IN SELF-TEST (BIST) AND OUTPUT TEST
The AD9627-11 includes built-in test features designed to enable
verification of the integrity of each channel as well as facilitate
board level debugging. A BIST (built-in self-test) feature is included
that verifies the integrity of the digital datapath of the AD9627-11.
Various output test options are also provided to place predictable
values on the outputs of the AD9627-11.
BUILT-IN SELF-TEST (BIST)
The BIST is a thorough test of the digital portion of the selected
AD9627-11 signal path. When enabled, the test runs from an
internal pseudorandom noise (PN) source through the digital
datapath, starting at the ADC block output. The BIST sequence
runs for 512 cycles and then stops. The BIST signature value for
Channel A or Channel B is placed in Register 0x24 and
Register 0x25. If one channel is chosen, its BIST signature is written
to the two registers. If both channels are chosen, the results from
Channel A are placed in the BIST signature registers.
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The outputs are not disconnected during this test, so the PN
sequence can be observed as it runs. The PN sequence can be
continued from its last value or reset from the beginning, based
on the value programmed in Register 0x0E, Bit 2. The BIST
signature result varies based on the channel configuration.
OUTPUT TEST MODES
The output test options are shown in Table 22. When an output
test mode is enabled, the analog section of the ADC is discon-
nected from the digital back end blocks and the test pattern is run
through the output formatting block. Some of the test patterns are
subject to output formatting, and some are not. The seed value for
the PN sequence tests can be forced if the PN reset bits are used
to hold the generator in reset mode by setting Bit 4 or Bit 5 of
Register 0x0D. These tests can be performed with or without
an analog signal (if present, the analog signal is ignored), but
they do require an encode clock. For more information, see
Application Note AN-877, Interfacing to High Speed ADCs via SPI.