ATMEGA324PV-10AU Atmel, ATMEGA324PV-10AU Datasheet - Page 260

IC MCU AVR 32K FLASH 44-TQFP

ATMEGA324PV-10AU

Manufacturer Part Number
ATMEGA324PV-10AU
Description
IC MCU AVR 32K FLASH 44-TQFP
Manufacturer
Atmel
Series
AVR® ATmegar
Datasheets

Specifications of ATMEGA324PV-10AU

Core Processor
AVR
Core Size
8-Bit
Speed
10MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
32
Program Memory Size
32KB (16K x 16)
Program Memory Type
FLASH
Eeprom Size
1K x 8
Ram Size
2K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 5.5 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
44-TQFP, 44-VQFP
Processor Series
ATMEGA32x
Core
AVR8
Data Bus Width
8 bit
Data Ram Size
2 KB
Interface Type
2-Wire/JTAG/SPI/USART
Maximum Clock Frequency
10 MHz
Number Of Programmable I/os
32
Number Of Timers
3
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
On-chip Adc
8-ch x 10-bit
Package
44TQFP
Device Core
AVR
Family Name
ATmega
Maximum Speed
10 MHz
Operating Supply Voltage
2.5|3.3|5 V
Controller Family/series
AVR MEGA
No. Of I/o's
32
Eeprom Memory Size
1KB
Ram Memory Size
2KB
Cpu Speed
10MHz
Rohs Compliant
Yes
For Use With
ATSTK600-TQFP44 - STK600 SOCKET/ADAPTER 44-TQFPATSTK600-DIP40 - STK600 SOCKET/ADAPTER 40-PDIP770-1007 - ISP 4PORT ATMEL AVR MCU SPI/JTAG770-1005 - ISP 4PORT FOR ATMEL AVR MCU JTAG770-1004 - ISP 4PORT FOR ATMEL AVR MCU SPIATAVRISP2 - PROGRAMMER AVR IN SYSTEM
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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21. JTAG Interface and On-chip Debug System
21.1
21.2
21.3
8011O–AVR–07/10
Features
Overview
TAP – Test Access Port
The AVR IEEE std. 1149.1 compliant JTAG interface can be used for
• Testing PCBs by using the JTAG Boundary-scan capability
• Programming the non-volatile memories, Fuses and Lock bits
• On-chip debugging
A brief description is given in the following sections. Detailed descriptions for Programming via
the JTAG interface, and using the Boundary-scan Chain can be found in the sections
ming via the JTAG Interface” on page 312
266, respectively. The On-chip Debug support is considered being private JTAG instructions,
and distributed within ATMEL and to selected third party vendors only.
Figure 21-1
TAP Controller is a state machine controlled by the TCK and TMS signals. The TAP Controller
selects either the JTAG Instruction Register or one of several Data Registers as the scan chain
(Shift Register) between the TDI – input and TDO – output. The Instruction Register holds JTAG
instructions controlling the behavior of a Data Register.
The ID-Register, Bypass Register, and the Boundary-scan Chain are the Data Registers used
for board-level testing. The JTAG Programming Interface (actually consisting of several physical
and virtual Data Registers) is used for serial programming via the JTAG interface. The Internal
Scan Chain and Break Point Scan Chain are used for On-chip debugging only.
The JTAG interface is accessed through four of the AVR’s pins. In JTAG terminology, these pins
constitute the Test Access Port – TAP. These pins are:
• TMS: Test mode select. This pin is used for navigating through the TAP-controller state
machine.
JTAG (IEEE std. 1149.1 Compliant) Interface
Boundary-scan Capabilities According to the IEEE std. 1149.1 (JTAG) Standard
Debugger Access to:
Extensive On-chip Debug Support for Break Conditions, Including
Programming of Flash, EEPROM, Fuses, and Lock Bits through the JTAG Interface
On-chip Debugging Supported by AVR Studio
– All Internal Peripheral Units
– Internal and External RAM
– The Internal Register File
– Program Counter
– EEPROM and Flash Memories
– AVR Break Instruction
– Break on Change of Program Memory Flow
– Single Step Break
– Program Memory Break Points on Single Address or Address Range
– Data Memory Break Points on Single Address or Address Range
shows a block diagram of the JTAG interface and the On-chip Debug system. The
and
®
”IEEE 1149.1 (JTAG) Boundary-scan” on page
ATmega164P/324P/644P
”Program-
260

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