SAF-TC1167-128F133HL AD Infineon Technologies, SAF-TC1167-128F133HL AD Datasheet - Page 56

• Manufacturer Part Number: SAF-TC1167-128F133HL AD
• Description: IC MCU 32BIT FLASH 176-LQFP
• Manufacturer: Infineon Technologies
• Series: TC116xr

Specifications of SAF-TC1167-128F133HL AD

• Core Processor: TriCore
• Core Size: 32-Bit
• Speed: 133MHz
• Connectivity: ASC, CAN, EBI/EMI, MLI, MSC, SSC
• Peripherals: DMA, POR, WDT
• Number Of I /o: 88
• Program Memory Size: 1MB (1M x 8)
• Program Memory Type: FLASH
• Ram Size: 128K x 8
• Voltage - Supply (vcc/vdd): 1.42 V ~ 1.58 V
• Data Converters: A/D 32x12b
• Oscillator Type: External
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 176-LFQFP
• Data Bus Width: 32 bit
• Data Ram Size: 104 KB
• Interface Type: ASC, MLI, MSC, SSC
• Maximum Clock Frequency: 133 MHz
• Number Of Programmable I/os: 88
• Number Of Timers: 3
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 2 (12 bit, 16 Channel) / 10 bit, 4 Channel
• Packages: PG-LQFP-176
• Max Clock Frequency: 133.0 MHz
• Sram (incl. Cache): 128.0 KByte
• Can Nodes: 2
• A / D Input Lines (incl. Fadc): 36
• Program Memory: 1.0 MB
• For Use With: B158-H8690-X-0-7600IN - KIT STARTER TC116X SERIES
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Details
• Other names: SP000602800

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2.5.4
Three options exist for the communication channel between Tools (e.g. Debugger,
Calibration Tool) and TC1167:
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2.5.5
Some manufacturing tests can be invoked by the application (e.g. after power-on) if
needed:
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2.5.6
To efficiently locate and identify faults after integration of a TC1167 into a system special
functions are available:
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1) This function requires access to some device pins (e.g. TESTMODE) in addition to those needed for OCDS.
Data Sheet
Invalidation of the Data Cache (maintaining write-back data) can be done
concurrently with the same SFR.
256 KB additional Overlay RAM on Emulation Device.
The 256 KB Trace memory of the Emulation Device can optionally be used for
Overlay also.
A dedicated trigger SFR with 32 independent status bits is provided to centrally post
requests from application code to the host computer.
The host is notified automatically when the trigger SFR is updated by the TriCoreor
PCP. No polling via a system bus is required.
Two wire DAP (Device Access Port) protocol for long connections or noisy
environments.
Four (or five) wire JTAG (IEEE 1149.1) for standardized manufacturing tests.
CAN (plus software linked into the application code) for low bandwidth deeply
embedded purposes.
DAP and JTAG are clocked by the tool.
Bit clock up to 40 MHz for JTAG, up to 80 MHz for DAP.
Hot attach (i.e. physical disconnect/reconnect of the host connection without reset of
the TC1167) for all interfaces.
Infineon standard DAS (Device Access Server) implementation for seamless,
transparent tool access over any supported interface.
Lock mechanism to prevent unauthorized tool access to critical application code.
Hardware-accelerated checksum calculation (e.g. for Flash content).
Boundary Scan (IEEE 1149.1) via JTAG and DAP.
SSCM (Single Scan Chain Mode
Tool Interfaces
Self-Test Support
FAR Support
1)
) for structural scan testing of the chip itself.
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Introduction
V1.3, 2009-10
TC1167