MCF5216CVF66 Freescale Semiconductor, MCF5216CVF66 Datasheet - Page 667

• Manufacturer Part Number: MCF5216CVF66
• Description: IC MPU 32BIT COLDF 256-MAPBGA
• Manufacturer: Freescale Semiconductor
• Series: MCF521xr

Specifications of MCF5216CVF66

• Core Processor: Coldfire V2
• Core Size: 32-Bit
• Speed: 66MHz
• Connectivity: CAN, EBI/EMI, I²C, SPI, UART/USART
• Peripherals: DMA, LVD, POR, PWM, WDT
• Number Of I /o: 142
• Program Memory Size: 512KB (512K x 8)
• Program Memory Type: FLASH
• Ram Size: 64K x 8
• Voltage - Supply (vcc/vdd): 2.7 V ~ 3.6 V
• Data Converters: A/D 8x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 256-MAPBGA
• Controller Family/series: ColdFire
• Ram Memory Size: 64KB
• Embedded Interface Type: CAN, I2C, SPI, UART
• No. Of Pwm Channels: 8
• Operating Temperature Range: -40°C To +85°C
• No. Of Pins: 256
• Rohs Compliant: No
• Package: 256MA-BGA
• Device Core: ColdFire
• Family Name: MCF521x
• Maximum Speed: 66 MHz
• Operating Supply Voltage: 3.3 V
• Data Bus Width: 32 Bit
• Number Of Programmable I/os: 142
• Interface Type: QSPI/UART/I2C/CAN
• On-chip Adc: 8-chx10-bit
• Number Of Timers: 8
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Eeprom Size: -

When one module is selected, the inputs into the other module are disabled or forced to a known logic level
as shown in
31.3.1.2 TCLK — Test Clock Input
The TCLK pin is a dedicated JTAG clock input to synchronize the test logic. Pulses on TCLK shift data
and instructions into the TDI pin on the rising edge and out of the TDO pin on the falling edge. TCLK is
independent of the processor clock. The TCLK pin has an internal pull-up resistor and holding TCLK high
or low for an indefinite period does not cause JTAG test logic to lose state information.
31.3.1.3 TMS/BKPT — Test Mode Select / Breakpoint
The TMS pin is the test mode select input that sequences the TAP state machine. TMS is sampled on the
rising edge of TCLK. The TMS pin has an internal pull-up resistor.
The BKPT pin is used to request an external breakpoint. Assertion of BKPT puts the processor into a halted
state after the current instruction completes.
31.3.1.4 TDI/DSI — Test Data Input / Development Serial Input
The TDI pin is the LSB-first data and instruction input. TDI is sampled on the rising edge of TCLK. The
TDI pin has an internal pull-up resistor.
The DSI pin provides data input for the debug module serial communication port.
31.3.1.5 TRST/DSCLK — Test Reset / Development Serial Clock
The TRST pin is an active low asynchronous reset input with an internal pull-up resistor that forces the
TAP controller to the test-logic-reset state.
Freescale Semiconductor
Table
The JTAG_EN does not support dynamic switching between JTAG and
BDM modes.
Module selected
Pin Function
31-3, in order to disable the corresponding module.
MCF5282 and MCF5216 ColdFire Microcontroller User’s Manual, Rev. 3
Disabling JTAG
Disabling BDM
Table 31-3. Signal State to the Disable Module
Table 31-2. Pin Function Selected
DSCLK
BKPT
BDM
DSO
DSI
—
JTAG_EN = 0
TRST = 0
TMS = 1
NOTE
—
TCLK
TRST
JTAG
TMS
TDO
TDI
Disable DSCLK
JTAG_EN = 1
BKPT = 1
DSI = 0
—
IEEE 1149.1 Test Access Port (JTAG)
DSCLK
BKPT
TCLK
DSO
DSI
—
31-3