XC3S1000-4FG456I Xilinx Inc, XC3S1000-4FG456I Datasheet - Page 76

• Manufacturer Part Number: XC3S1000-4FG456I
• Description: FIELD PROGRAMMABLE GATE ARRAY
• Manufacturer: Xilinx Inc
• Series: Spartan™-3r

Specifications of XC3S1000-4FG456I

• Number Of Logic Elements/cells: 17280
• Number Of Labs/clbs: 1920
• Total Ram Bits: 442368
• Number Of I /o: 333
• Number Of Gates: 1000000
• Voltage - Supply: 1.14 V ~ 1.26 V
• Mounting Type: Surface Mount
• Operating Temperature: -40°C ~ 100°C
• Package / Case: 456-BBGA
• Package: 456FBGA
• Family Name: Spartan®-3
• Device Logic Units: 17280
• Device System Gates: 1000000
• Maximum Internal Frequency: 630 MHz
• Typical Operating Supply Voltage: 1.2 V
• Maximum Number Of User I/os: 333
• Ram Bits: 442368
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

Spartan-3 FPGA Family: DC and Switching Characteristics
Timing Measurement Methodology
When measuring timing parameters at the programmable
I/Os, different signal standards call for different test condi-
tions.
dard.
The method for measuring Input timing is as follows: A sig-
nal that swings between a Low logic level of V
logic level of V
standards also require the application of a bias voltage to
the V
input-switching threshold. The measurement point of the
Input signal (V
and V
The Output test setup is shown in
voltage V
end of which is connected to the Output. For each standard,
R
mended for minimizing signal reflections. If the standard
does not ordinarily use terminations (e.g., LVCMOS,
Table 47: Test Methods for Timing Measurement at I/Os
76
Single-Ended
GTL
GTL_DCI
GTLP
GTLP_DCI
HSLVDCI_15
HSLVDCI_18
HSLVDCI_25
HSLVDCI_33
HSTL_I
HSTL_I_DCI
HSTL_III
HSTL_III_DCI
HSTL_I_18
HSTL_I_DCI_18
HSTL_II_18
HSTL_II_DCI_18
HSTL_III_18
HSTL_III_DCI_18
LVCMOS12
LVCMOS15
LVDCI_15
LVDCI_DV2_15
HSLVDCI_15
T
and V
Signal Standard
Table 47
H
(IOSTANDARD)
REF
.
T
T
is applied to the termination resistor R
pins of a given bank to properly set the
generally take on the standard values recom-
M
presents the conditions to use for each stan-
H
) is commonly located halfway between V
is applied to the Input under test. Some
V
REF
0.90
0.75
0.90
0.90
0.8
1.0
0.9
1.1
-
-
Figure
(V)
33. A termination
V
V
V
V
V
V
V
V
REF
REF
REF
REF
REF
REF
REF
REF
V
L
Inputs
L
and a High
0
0
T
(V)
, the other
- 0.2
- 0.2
- 0.5
- 0.5
- 0.5
- 0.5
- 0.5
- 0.5
www.xilinx.com
L
V
V
V
V
V
V
V
V
REF
REF
REF
REF
REF
REF
REF
REF
V
LVTTL), then R
tion, and V
(V
H
1.2
1.5
(V)
+ 0.2
+ 0.2
+ 0.5
+ 0.5
+ 0.5
+ 0.5
+ 0.5
+ 0.5
M
) that was used at the Input is also used at the Output.
Notes:
1.
FPGA Output
T
is set to zero. The same measurement point
Figure 33: Output Test Setup
The names shown in parentheses are
used in the IBIS file.
T
R
1M
1M
1M
T
is set to 1MΩ to indicate an open connec-
25
50
25
50
50
50
50
50
50
(Ω)
Outputs
V
T
(V
DS099-3 (v2.5) December 4, 2009
REF
R
C
T
L
V
0.75
(R
T
1.2
1.2
1.5
1.5
1.5
0.9
0.9
1.8
)
(C
V
0
0
0
(V)
M
REF
REF
(V
ds099-3_07_012004
Product Specification
)
MEAS
)
)
Inputs and
Outputs
V
V
V
V
V
V
V
V
0.75
0.90
1.25
1.65
0.75
M
0.6
REF
REF
REF
REF
REF
REF
REF
(V)
R