IDT82V2108BB IDT, Integrated Device Technology Inc, IDT82V2108BB Datasheet - Page 278
IDT82V2108BB
Manufacturer Part Number
IDT82V2108BB
Description
IC FRAMER T1/J1/E1 8CH 144-BGA
Manufacturer
IDT, Integrated Device Technology Inc
Datasheet
1.IDT82V2108PX8.pdf
(292 pages)
Specifications of IDT82V2108BB
Controller Type
T1/E1/J1 Framer
Interface
Parallel
Voltage - Supply
2.97 V ~ 3.63 V
Current - Supply
160mA
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
144-BGA
Screening Level
Industrial
Mounting
Surface Mount
Operating Temperature (min)
-40C
Operating Temperature (max)
85C
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Other names
82V2108BB
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IDT82V2108
6
ACCESS PORT
as described in the IEEE 1149.1 standards.
registers plus a Test Access Port (TAP) controller. Control of the TAP is
achieved through signals applied to the Test Mode Select (TMS) and
Test Clock (TCK) input pins. Data is shifted into the registers via the Test
IEEE STD 1149.1 JTAG Test Access Port
The IDT82V2108 supports the digital Boundary Scan Specification
The boundary scan architecture consists of data and instruction
IEEE STD 1149.1 JTAG TEST
TRST
TCK
TMS
TDI
(Test Access Port)
Controller
TAP
IDR (Device Identification Register)
BSR (Boundary Scan Register)
IR (Instruction Register)
BR (Bypass Register)
Figure 85. JTAG Architecture
Control<6:0>
268
Data Input (TDI) pin, and shifted out of the registers via the Test Data
Output (TDO) pin. Both TDI and TDO are clocked at a rate determined
by TCK.
Register), IDR (Device Identification Register), BR (Bypass Register)
and IR (Instruction Register). These will be described in the following
pages. Refer to Figure 85 for architecture.
The JTAG boundary scan registers includes BSR (Boundary Scan
Output Enable
Select
MUX
T1 / E1 / J1 OCTAL FRAMER
TDO
March 5, 2009
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