NAND01GR3B2CZA6E Micron Technology Inc, NAND01GR3B2CZA6E Datasheet - Page 52

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NAND01GR3B2CZA6E

Manufacturer Part Number
NAND01GR3B2CZA6E
Description
Manufacturer
Micron Technology Inc
Datasheet

Specifications of NAND01GR3B2CZA6E

Cell Type
NAND
Density
1Gb
Access Time (max)
25us
Interface Type
Parallel
Boot Type
Not Required
Address Bus
8b
Operating Supply Voltage (typ)
1.8V
Operating Temp Range
-40C to 85C
Package Type
VFBGA
Program/erase Volt (typ)
1.7 to 1.95V
Sync/async
Asynchronous
Operating Temperature Classification
Industrial
Operating Supply Voltage (min)
1.7V
Operating Supply Voltage (max)
1.95V
Word Size
8b
Number Of Words
128M
Supply Current
20mA
Mounting
Surface Mount
Pin Count
63
Lead Free Status / Rohs Status
Compliant

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DC and AC parameters
1. The time to ready depends on the value of the pull-up resistor tied to the ready/busy pin. See
2.
3. During a program/erase enable operation, t
4. t
5. ES = electronic signature.
Figure 21. Command Latch AC waveforms
52/67
Figure
During a program/erase disable Operation, t
t
RLQX
WHWH
I/O
CL
AL
W
E
is valid when frequency is higher than 33 MHz, t
36.
is the time from W rising edge during the final address cycle to W rising edge during the first data cycle.
(ALSetup time)
H(E Setup time)
(CL Setup time)
tALLWH
tELWH
tCLHWH
(Data Setup time)
tDVWH
WW
WW
is the delay from WP high to W High.
is the delay from WP Low to W High.
RHQX
Command
is valid for frequency lower than 33 MHz.
tWLWH
tWHDX
(Data Hold time)
(E Hold time)
tWHEH
(CL Hold time)
tWHCLL
(AL Hold time)
tWHALH
Figure
34,
Figure 35
NAND01G-B2C
and
ai13105

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