mfrc531 NXP Semiconductors, mfrc531 Datasheet - Page 72

• Manufacturer Part Number: mfrc531
• Description: Iso/iec 14443 Reader Ic
• Manufacturer: NXP Semiconductors

NXP Semiconductors
MFRC531_34
Product data sheet
PUBLIC
10.5.8.4 Reserved register 3Bh
10.5.8.5 Reserved register 3Ch
10.5.8.6 TestDigiSelect register
Table 124. Reserved register (address: 3Bh) reset value: xxxx xxxxb, xxh bit allocation
Remark: This register is reserved for future use.
Table 125. Reserved register (address: 3Ch) reset value: xxxx xxxxb, xxh bit allocation
Remark: This register is reserved for future use.
Selects digital test mode.
Table 126. TestDigiSelect register (address: 3Dh) reset value: xxxx xxxxb, xxh bit allocation
Table 127. TestDigiSelect register bit descriptions
Bit
Symbol
Access
Bit
Symbol
Access
Bit
Symbol
Access
Bit
7
6 to 0
Symbol
SignalToMFOUT
TestDigiSignalSel[6:0]
SignalToMFOUT
W
W
7
x
7
x
W
7
Rev. 3.4 — 26 January 2010
W
W
6
6
x
x
056634
6
Value
1
0
-
F4h
E4h
D4h
C4h
B5h
A5h
96h
83h
E2h
W
W
5
x
5
x
Description
overrules the MFOUTSelect[2:0] setting and routes the
digital test signal defined with the TestDigiSignalSel[6:0]
bits to pin MFOUT
MFOUTSelect[2:0] defines the signal on pin MFOUT
selects the digital test signal to be routed to pin MFOUT.
Refer to
information. The following lists the signal names for the
TestDigiSignalSel[6:0] addresses:
5
s_data
s_valid
s_coll
s_clock
rd_sync
wr_sync
int_clock
BPSK_out
BPSK_sig
W
W
4
4
x
x
Section 15.2.3 on page 104
TestDigiSignalSel[6:0]
4
W
W
3
x
3
x
W
3
W
W
ISO/IEC 14443 reader IC
2
x
2
x
2
MFRC531
© NXP B.V. 2010. All rights reserved.
for detailed
W
W
1
x
1
x
1
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W
W
0
x
0
x
0