EP20K400CB652C7 Altera, EP20K400CB652C7 Datasheet - Page 54

• Manufacturer Part Number: EP20K400CB652C7
• Description: APEX 20KC
• Manufacturer: Altera

APEX 20KC Programmable Logic Device Data Sheet
Generic Testing
Operating
Conditions
54
V
V
V
I
T
T
T
Symbol
Table 17. APEX 20KC Device Absolute Maximum Ratings
OUT
STG
AMB
J
CCINT
CCIO
I
Supply voltage
DC input voltage
DC output current, per pin
Storage temperature
Ambient temperature
Junction temperature
Parameter
■
Each APEX 20KC device is functionally tested. Complete testing of each
configurable SRAM bit and all logic functionality ensures 100% yield.
AC test measurements for APEX 20KC devices are made under conditions
equivalent to those defined in the
Multiple test patterns can be used to configure devices during all stages of
the production flow. AC test criteria include:
■
■
■
■
Tables 17
recommended operating conditions, DC operating conditions, and
capacitance for 1.8-V APEX 20KC devices.
Jam Programming & Test Language Specification
Power supply transients can affect AC measurements.
Simultaneous transitions of multiple outputs should be avoided for
accurate measurement.
Threshold tests must not be performed under AC conditions.
Large-amplitude, fast-ground-current transients normally occur as
the device outputs discharge the load capacitances. When these
transients flow through the parasitic inductance between the device
ground pin and the test system ground, significant reductions in
observable noise immunity can result.
With respect to ground
No bias
Under bias
PQFP, RQFP, TQFP, and BGA
packages, under bias
Ceramic PGA packages, under bias
through
20
provide information on absolute maximum ratings,
Conditions
(2)
Note (1)
“Timing Model” section on page
–0.5
–0.5
–0.5
Min
–25
–65
–65
Altera Corporation
Max
150
135
135
150
2.5
4.6
4.6
25
65.
Unit
mA
° C
° C
° C
° C
V
V
V