TS8388BMFSB_Q Atmel Corporation, TS8388BMFSB_Q Datasheet - Page 11

• Manufacturer Part Number: TS8388BMFSB_Q
• Description: ADC 8-bit 1 Gsps.
• Manufacturer: Atmel Corporation

Explanation of
Test Levels
Functions
Description
Table 5. Functions Description
2144C–BDC–04/03
Name
V
V
V
GND
V
CLK, CLKB
<D0:D7>
<D0B:D7B>
DR, DRB
OR, ORB
GAIN
GORB
DIOD/DRRB
CC
EE
PLUSD
IN
, V
INB
Function
Positive power supply
Analog negative power supply
Digital positive power supply
Ground
Differential analog inputs
Differential clock inputs
Differential output data port
Differential data ready outputs
Out of range outputs
ADC gain adjust
Gray or Binary digital output select
Die junction temperature measurement/
asynchronous data ready reset
Table 4. Explanation of Test Levels
Notes:
Num
1
2
3
4
5
6
1. Unless otherwise specified, all tests are pulsed tests: therefore Tj = Tc = Ta, where Tj, Tc
2. Refer to “Ordering Information” on page 50.
3. Only MIN and MAX values are guaranteed (typical values are issuing from characterization
and Ta are junction, case and ambient temperature respectively.
results).
Characteristics
100% production tested at +25 C
100% production tested at +25 C
(for “V” and “M” Temperature range
Sample tested only at specified temperatures.
Parameter is guaranteed by design and characterization testing (thermal steady-state
conditions at specified temperature).
Parameter is a typical value only.
100% production tested over specified temperature range
(for “B/Q” Temperature range
(2)
GORG
DIOD/
DRRB
CLKB
GAIN
VINB
).
CLK
VIN
DVEE = -5V
(1)
(1)
, and sample tested at specified temperatures
(2)
VCC = +5V
(for “C” Temperature range
).
VEE = -5V
TS8388B
VPLUSD = +2.4V (LVDS)
VPLUSD = +0V (ECL)
GND
(2)
).
16
OR
ORB
D0
D0B
DR
DRB
TS8388B
D7
D7B
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