mfrc522 NXP Semiconductors, mfrc522 Datasheet - Page 42

• Manufacturer Part Number: mfrc522
• Description: Contactless Reader Ic
• Manufacturer: NXP Semiconductors

NXP Semiconductors
112132
Product data sheet
9.2.4.6 TestBusReg
9.2.4.7 AutoTestReg
9.2.4.8 VersionReg
Shows the status of the internal testbus.
Table 113: TestBusReg register (address 35h); reset value: XXh
Table 114: Description of TestBusReg bits
Controls the digital selftest.
Table 115: AutoTestReg register (address 36h); reset value: 40h
Table 116: Description of AutoTestReg bits
Shows the version.
Table 117: VersionReg register (address 37h); reset value: XXh
Table 118: Description of VersionReg bits
Bit
7 to 0
Bit
7
6
5 to 4
3 to 0
Bit
7 to 0
Symbol
Access
Symbol
Access
Symbol
Access
Rights
Rights
Rights
Bit
Bit
Bit
Symbol
-
AmpRcv
-
SelfTest
Symbol
TestBus
Symbol
Version
RFU
7
7
7
-
AmpRcv
Description
Reserved for production tests.
If set to logic 1, the internal signal processing in the receiver chain is
performed non-linear. This increases the operating distance in
communication modes at 106 kbit/s.
Remark: Due to the non linearity the effect of the bits MinLevel and
Reserved for production tests.
command in the command register. The selftest is enabled by 1001b.
Remark: For default operation the selftest has to be disabled by 0000b.
Enables the digital self test. The selftest can be started by the selftest
r/w
Rev. 3.2 — 22 May 2007
6
6
6
Description
Shows the status of the internal test bus. The test bus is selected by
the register TestSel2Reg. See
Description
Indicates current version.
Remark: The current version for MFRC522 is 90h or 91h.
CollLevel in the register RxThreshholdReg are as well non linear.
5
5
5
RFT
-
4
4
4
TestBus
Version
r
r
Section 19
3
3
3
“Testsignals”.
2
2
2
Contactless Reader IC
SelfTest
r/w
MFRC522
© NXP B.V. 2007. All rights reserved.
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