mfrc522 NXP Semiconductors, mfrc522 Datasheet - Page 44

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mfrc522

Manufacturer Part Number
mfrc522
Description
Contactless Reader Ic
Manufacturer
NXP Semiconductors
Datasheet

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NXP Semiconductors
112132
Product data sheet
9.2.4.10 TestDAC1Reg
9.2.4.12 TestADCReg
9.2.4.11 TestDAC2Reg
Defines the test values for TestDAC1.
Table 121: TestDAC1Reg register (address 39h); reset value: XXh
Table 122: Description of TestDAC1Reg bits
Defines the test value for TestDAC2.
Table 123: TestDAC2Reg register (address 3Ah); reset value: XXh
Table 124: Description ofTestDAC2Reg bits
Shows the actual value of ADC I and Q channel.
Table 125: TestADCReg register (address 3Bh); reset value: XXh
Table 126: Description of TestADCReg bits
Bit
7
6
5 to 0
Bit
7 to 6
5 to 0
Bit
7 to 4
3 to 0
Symbol
Access
Symbol
Access
Symbol
Access
Rights
Rights
Rights
Bit
Bit
Bit
Symbol
-
-
TestDAC1
Symbol
-
TestDAC2
Symbol
ADC_I
ADC_Q
7
7
7
RFU
RFU
-
-
Rev. 3.2 — 22 May 2007
6
6
6
Description
Reserved for production tests.
Reserved for future use.
Defines the test value for TestDAC1. The output of the DAC1 can be
switched to AUX1 by setting AnalogSelAux1 to 0001b in register
AnalogTestReg.
Description
Reserved for future use.
Defines the testvalue for TestDAC2. The output of the DAC2 can be
switched to AUX2 by setting AnalogSelAux2 to 0001b in register
AnalogTestReg.
Description
Shows the actual value of ADC I channel.
Shows the actual value of ADC Q channel.
ADC_I
r
5
5
5
4
4
4
3
3
3
TestDAC1
TestDAC2
r/w
r/w
2
2
2
Contactless Reader IC
ADC_Q
MFRC522
r
© NXP B.V. 2007. All rights reserved.
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