mfrc522 NXP Semiconductors, mfrc522 Datasheet - Page 76

• Manufacturer Part Number: mfrc522
• Description: Contactless Reader Ic
• Manufacturer: NXP Semiconductors

NXP Semiconductors
19. Testsignals
112132
Product data sheet
19.1 Selftest
19.2 Test bus
The MFRC522 has the capability to perform a digital selftest. To start the selftest the
following procedure has to be performed:
Correct answer for register VersionReg equal to 90h:
00h, 87h, 98h, 0fh, 49h, FFh, 07h, 19h
BFh, 22h, 30h, 49h, 59h, 63h, ADh, CAh
7Fh, E3h, 4Eh, 03h, 5Ch, 4Eh, 49h, 50h
47h, 9Ah, 37h, 61h, E7h, E 2h, C6h, 2Eh
75h, 5Ah, EDh, 04h, 3Dh, 02h, 4Bh, 78h
32h, FFh, 58h, 3Bh, 7Ch, E9h, 00h, 94h
B4h, 4Ah, 59h, 5Bh, FDh, U9h, 29h, DFh
35h, 96h, 98h, 9Eh, 4Fh, 30h, 32h, 8Dh
Correct answer for register VersionReg equal to 91h:
00h, C6h, 37h, D5h, 32h, B7h, 57h, 5Ch,
C2h, D8h, 7Ch, 4Dh, D9h, 70h, C7h, 73h,
10h, E6h, D2h, AAh, 5Eh, A1h, 3Eh, 5Ah,
14h, AFh, 30h, 61h, C9h, 70h, DBh, 2Eh,
64h, 22h, 72h, B5h, BDh, 65h, F4h, ECh,
22h, BCh, D3h, 72h, 35h, CDh, AAh, 41h,
1Fh, A7h, F3h, 53h, 14h, DEh, 7Eh, 02h,
D9h, 0Fh, B5h, 5Eh, 25h, 1Dh, 29h, 79h
The test bus is implemented for production test purposes. The following configuration can
be used to improve the design of a system using the MFRC522. The test bus allows to
route internal signals to the digital interface. The test bus signals are selected by
accessing TestBusSel in register TestSel2Reg.
Table 150: TestSel2Reg register (address 07h)
1. Perform a soft reset.
2. Clear the internal buffer by writing 25 bytes of 00h and perform the Config Command.
3. Enable the Selftest by writing the value 09h to the register AutoTestReg.
4. Write 00h to the FIFO.
5. Start the Selftest with the CalcCRC Command.
6. The Selftest will be performed.
7. When the Selftest is finished, the FIFO contains the following bytes:
Testsignal
Pins
sdata
D6
Rev. 3.2 — 22 May 2007
scoll
D5
svalid
D4
sover
D3
RCV_reset
D2
Contactless Reader IC
MFRC522
© NXP B.V. 2007. All rights reserved.
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