mfrc522 NXP Semiconductors, mfrc522 Datasheet - Page 77

• Manufacturer Part Number: mfrc522
• Description: Contactless Reader Ic
• Manufacturer: NXP Semiconductors

NXP Semiconductors
112132
Product data sheet
19.3 Testsignals at pin AUX
Table 151: Description of Testsignals
Table 152: TestSel2Reg register (address 0Dh)
Table 153: Description of Testsignals
With the MFRC522, the user may select internal signals to measure them at pin AUX.
These measurements can be helpful during the design-in phase to optimise the design or
for test purpose.
Table 154
setting SelAux1 or SelAux2 in the register AnalogTestReg.
Please also refer to register AnalogSelAux.
Remark: The DAC has a current output. It is recommended to use a 1 kΩ pull-down
resistance at pins AUX1/AUX2.
Table 154: Testsignals description
Pins
D6
D5
D4
D3
D2
D1
Pins
D6
D5
D4 to D3
D2
D1
SelAux
0000
0001
0010
0011
0100
0101
0110
0111 - 1001
1010
1011
Testsignal
Pins
shows an overview of the signal that can be switched to pin AUX1 or AUX2 by
Testsignal
sdata
scoll
svalid
sover
RCV_reset
-
Testsignal
clkstable
clk27/8
-
clk27
-
clkstable
D6
Description for Aux1 / Aux2
Tristate
DAC: register TestDAC 1/2
DAC: testsignal corr1
Reserved
DAC: testsignal MinLevel
DAC: ADC_I
DAC: ADC_Q
Reserved
High
low
Rev. 3.2 — 22 May 2007
clk27/8
Description
shows the actual received data stream.
shows if in the actual bit a collision has been detected (106 kbit/s only)
shows if sdata and scoll are valid
shows that the receiver has detected a stop condition
shows if the receiver is reset
reserved
Description
shows if the oscillator delivers a stable signal.
shows the output signal of the oscillator divided by 8
reserved
shows the output signal of the oscillator
reserved
D5
D4
-
D3
-
clk27
D2
Contactless Reader IC
MFRC522
© NXP B.V. 2007. All rights reserved.
D1
-
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