mfrc522 NXP Semiconductors, mfrc522 Datasheet - Page 43

• Manufacturer Part Number: mfrc522
• Description: Contactless Reader Ic
• Manufacturer: NXP Semiconductors

NXP Semiconductors
112132
Product data sheet
9.2.4.9 AnalogTestReg
Controls the pins AUX1 and AUX2
Table 119: AnalogTestReg register (address 38h); reset value: 00h
Table 120: Description of AnalogTestReg bits
[1]
Bit
7 to 4
3 to 0
Symbol
Access
Rights
Bit
Remark: Current output. The use of 1 kΩ pull-down resistor on AUX is recommended
Symbol
AnalogSelAux1
AnalogSelAux2
7
AnalogSelAux1
Rev. 3.2 — 22 May 2007
6
Description
Controls the AUX pin.
Remark: All test signals are described in
Value
0000
0001
0010
0011
0100
0101
0110
0111
1000
1001
1010
1011
1100
1101
1110
1111
r/w
Description
Tristate
Output of TestDAC1 (AUX1), output of TestDAC2 (AUX2)
Testsignal Corr1
Reserved
Testsignal MinLevel
Testsignal ADC channel I
Testsignal ADC channel Q
Reserved
Reserved, Testsignal for production test
Reserved
HIGH
LOW
TxActive
At 106 kbit/s: HIGH during Startbit, Databit, Parity and CRC.
At 212, 424 and 848 kbit/s: High during Data and CRC.
RxActive
At 106 kbit/s: High during Databit, Parity and CRC.
At 212, 424 and 848 kbit/s: High during Data and CRC.
Subcarrier detected
106 kbit/s: not applicable
212, 424 and 848 kbit/s: High during last part of Data and
CRC.
Test bus bit as defined by the TstBusBitSel in register
TestSel1Reg.
5
4
[1]
[1]
3
[1]
[1]
Section 19
AnalogSelAux2
2
Contactless Reader IC
r/w
[1]
MFRC522
© NXP B.V. 2007. All rights reserved.
“Testsignals”.
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