DS33Z11 Maxim Integrated Products, DS33Z11 Datasheet - Page 163

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DS33Z11

Manufacturer Part Number
DS33Z11
Description
Network Controller & Processor ICs Ethernet Mapper Ethe rnet-Serial TDM Ethe
Manufacturer
Maxim Integrated Products
Datasheet

Specifications of DS33Z11

Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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12 JTAG INFORMATION
The device supports the standard instruction codes SAMPLE:PRELOAD, BYPASS, and EXTEST. Optional public
instructions included are HIGHZ, CLAMP, and IDCODE. See
required by IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture.
Test Access Port (TAP)
TAP Controller
Instruction Register
Bypass Register
Boundary Scan Register
Device Identification Register
The Test Access Port has the necessary interface pins: JTRST, JTCLK, JTMS, JTDI, and JTDO. See the pin
descriptions for details. Refer to IEEE 1149.1-1990, IEEE 1149.1a-1993, and IEEE 1149.1b-1994 for details
about the Boundary Scan Architecture and the Test Access Port.
Figure 12-1 JTAG Functional Block Diagram
12.1 JTAG TAP Controller State Machine Description
This section covers the details on the operation of the Test Access Port (TAP) Controller State Machine. The TAP
controller is a finite state machine that responds to the logic level at JTMS on the rising edge of JTCLK.
10K
JTDI
10K
JTMS
Bypas
Register
Register
Register
Register
Controller
Instruction
Identification
Boundary Scan
Test Access Port
JTCLK
10K
JTRST
163 of 172
Select
Tri-State
Mux
Table
JTDO
12-1. The DS33Z11 contains the following as

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