DS26502L+ Maxim Integrated Products, DS26502L+ Datasheet - Page 103

• Manufacturer Part Number: DS26502L+
• Description: IC T1/E1/J1 64KCC ELEMENT 64LQFP
• Manufacturer: Maxim Integrated Products
• Type: BITS Elementr

Specifications of DS26502L+

• Voltage - Supply: 3.135 V ~ 3.465 V
• Operating Temperature: 0°C ~ 70°C
• Mounting Type: Surface Mount
• Package / Case: 64-LQFP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Frequency-max: -
• Output: -
• Input: -

17.1 Instruction Register
The instruction register contains a shift register as well as a latched parallel output and is 3 bits in length.
When the TAP controller enters the shift-IR state, the instruction shift register will be connected between
JTDI and JTDO. While in the shift-IR state, a rising edge on JTCLK with JTMS LOW will shift the data
one stage toward the serial output at JTDO. A rising edge on JTCLK in the exit1-IR state or the exit2-IR
state with JTMS HIGH will move the controller to the update-IR state. The falling edge of that same
JTCLK will latch the data in the instruction shift register to the instruction parallel output.
Table 17-1. Instruction Codes for IEEE 1149.1 Architecture
SAMPLE/PRELOAD
This is a mandatory instruction for the IEEE 1149.1 specification that supports two functions. The digital
I/Os of the device can be sampled at the boundary scan register without interfering with the normal
operation of the device by using the capture-DR state. SAMPLE/PRELOAD also allows the device to
shift data into the boundary scan register via JTDI using the shift-DR state.
BYPASS
When the BYPASS instruction is latched into the parallel instruction register, JTDI connects to JTDO
through the one-bit bypass test register. This allows data to pass from JTDI to JTDO not affecting the
device’s normal operation.
EXTEST
This allows testing of all interconnections to the device. When the EXTEST instruction is latched in the
instruction register, the following actions occur. Once enabled via the Update-IR state, the parallel
outputs of all digital output pins will be driven. The boundary scan register will be connected between
JTDI and JTDO. The Capture-DR will sample all digital inputs into the boundary scan register.
CLAMP
All digital outputs of the device will output data from the boundary scan parallel output while connecting
the bypass register between JTDI and JTDO. The outputs will not change during the CLAMP instruction.
HIGHZ
All digital outputs of the device will be placed in a high-impedance state. The BYPASS register will be
connected between JTDI and JTDO.
SAMPLE/PRELOAD
INSTRUCTION
BYPASS
EXTEST
IDCODE
CLAMP
HIGHZ
SELECTED REGISTER
Device Identification
Boundary Scan
Boundary Scan
Bypass
Bypass
Bypass
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INSTRUCTION CODES
010
111
000
011
100
001