SAM7L128 Atmel Corporation, SAM7L128 Datasheet - Page 517

• Manufacturer Part Number: SAM7L128
• Manufacturer: Atmel Corporation

Specifications of SAM7L128

• Flash (kbytes): 128 Kbytes
• Pin Count: 144
• Max. Operating Frequency: 36 MHz
• Cpu: ARM7TDMI
• Hardware Qtouch Acquisition: No
• Max I/o Pins: 80
• Ext Interrupts: 80
• Usb Speed: No
• Usb Interface: No
• Spi: 1
• Twi (i2c): 1
• Uart: 3
• Segment Lcd: 40
• Graphic Lcd: No
• Video Decoder: No
• Camera Interface: No
• Adc Channels: 4
• Adc Resolution (bits): 10
• Adc Speed (ksps): 460
• Resistive Touch Screen: No
• Temp. Sensor: No
• Crypto Engine: No
• Sram (kbytes): 6
• Self Program Memory: YES
• Dram Memory: No
• Nand Interface: No
• Picopower: No
• Temp. Range (deg C): -40 to 85
• I/o Supply Class: 1.8/3.3
• Operating Voltage (vcc): 1.8 to 3.6
• Fpu: No
• Mpu / Mmu: no / no
• Timers: 3
• Output Compare Channels: 3
• Input Capture Channels: 3
• Pwm Channels: 4
• 32khz Rtc: Yes
• Calibrated Rc Oscillator: No

35. AT91SAM7L128/64 Electrical Characteristics
35.1
Table 35-1.
6257A–ATARM–20-Feb-08
Operating Temperature (Industrial) .................-40°C to + 85°C *NOTICE:
Storage Temperature.....................................-60°C to + 150°C
Voltage on Input Pins
with Respect to Ground...... ..............................-0.3V to + 5.5V
Maximum Operating Voltage
(VDDCORE ) .....................................................................2.0V
Maximum Operating Voltage
(VDDIO1, VDDIO2 and VDDINLCD)...................................4.0V
Total DC Output Current on all I/O lines
128-lead LQFP/144-ball LFBGA...................................100 mA
Absolute Maximum Ratings
Absolute Maximum Ratings*
AT91SAM7L128/64 Preliminary
Stresses beyond those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation of the
device at these or other conditions beyond those indi-
cated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating condi-
tions for extended periods may affect device reliability.
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