GS4910B GENNUM [Gennum Corporation], GS4910B Datasheet - Page 105

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GS4910B

Manufacturer Part Number
GS4910B
Description
HD/SD/Graphics Clock and Timing Generator with GENLOCK
Manufacturer
GENNUM [Gennum Corporation]
Datasheet
3.13 JTAG
When the JTAG/HOST input pin of the GS4911B/GS4910B is set HIGH, the host
interface port will be configured for JTAG test operation. In this mode, pins 57
through 60 become TCLK, TDI, TDO, and TMS. In addition, the RESET pin will
operate as the test reset pin.
Boundary scan testing using the JTAG interface will be enabled in this mode.
There are two methods in which JTAG can be used on the GS4911B/GS4910B:
1. As a stand-alone JTAG interface to be used at in-circuit ATE (Automatic Test
2. Under control of the host for applications such as system power on self tests.
When the JTAG tests are applied by ATE, care must be taken to disable any other
devices driving the digital I/O pins. If the tests are to be applied only at ATE, this
can be accomplished with high-impedance buffers used in conjunction with the
JTAG/HOST input signal. This is shown in
Figure 3-19: In-Circuit JTAG
Alternatively, if the test capabilities are to be used in the system, the host may still
control the JTAG/HOST input signal, but some means for tri-stating the host must
exist in order to use the interface at ATE. This is represented in
36655 - 2
Application HOST
Equipment) during PCB assembly; or
April 2006
In-circuit ATE probe
GS4911B/GS4910B Data Sheet
Figure
3-19.
SDIN_TDI
CS_TMS
SCLK_TCLK
SDOUT_TDO
JTAG/HOST
GS4911B/GS4910B
Figure
105 of 113
3-20.

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