MCF5272CVF66 Freescale Semiconductor, MCF5272CVF66 Datasheet - Page 476

• Manufacturer Part Number: MCF5272CVF66
• Description: IC MPU 32BIT 66MHZ 196-MAPBGA
• Manufacturer: Freescale Semiconductor
• Series: MCF527xr

Specifications of MCF5272CVF66

• Core Processor: Coldfire V2
• Core Size: 32-Bit
• Speed: 66MHz
• Connectivity: EBI/EMI, Ethernet, I²C, SPI, UART/USART, USB
• Peripherals: DMA, WDT
• Number Of I /o: 32
• Program Memory Size: 16KB (4K x 32)
• Program Memory Type: ROM
• Ram Size: 1K x 32
• Voltage - Supply (vcc/vdd): 3 V ~ 3.6 V
• Oscillator Type: External
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 196-MAPBGA
• Family Name: MCF5xxx
• Device Core: ColdFire
• Device Core Size: 32b
• Frequency (max): 66MHz
• Instruction Set Architecture: RISC
• Supply Voltage 1 (typ): 3.3V
• Operating Temp Range: -40C to 85C
• Operating Temperature Classification: Industrial
• Mounting: Surface Mount
• Pin Count: 196
• Package Type: MA-BGA
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Eeprom Size: -
• Data Converters: -
• Lead Free Status / Rohs Status: Not Compliant

IEEE 1149.1 Test Access Port (JTAG)
Figure 21-1
21.2
The JTAG test interface shares pins with the debug modules (see
21-2
PSTCLK
Signal
BKPT
TMS/
TDO/
TCK/
DSO
TMS
TCK
TDI
JTAG Test Access Port and BDM Debug Port
Test clock. TCK is the dedicated JTAG test logic clock input, independent of the CPU system clock. It provides a
clock for on-board test logic defined by the IEEE 1149.1 standard. TCK should be grounded if the JTAG port is not
used and MTMOD is tied low.
Test mode select. This input controls test mode operations for on-board test logic defined by the IEEE 1149.1
standard. Connecting TMS to VDD disables the test controller, making all JTAG circuits transparent to the system.
Test and debug data out. Output for shifting data out of serial data port logic. Shifting out data depends on the state
of the JTAG controller state machine and the instructions in the instruction register. The shift occurs on the falling
edge of TCK. When not outputting data, TDO is placed in high-impedance state. TDO can also be three-stated to
allow bused or parallel connections to other devices having JTAG test access ports.
shows the MCF5272 implementation of IEEE 1149.1.
Precautions to ensure that the IEEE 1149.1 test logic does not interfere with
non-test operation are described in
Operation.”
Controller
TAP
MCF5272 ColdFire
3
4-Bit Instruction Register
Figure 21-1. Test Access Port Block Diagram
Boundary-Scan Register
Decoder
Test Data Register
®
Integrated Microprocessor User’s Manual, Rev. 3
Table 21-1. JTAG Signals
ID (32 bits)
Bypass
0
(1 Bit)
NOTE
Section 21.7, “Non-IEEE 1149.1
Description
Table
21-1).
Freescale Semiconductor
TDC