MCF5272CVF66 Freescale Semiconductor, MCF5272CVF66 Datasheet - Page 477

IC MPU 32BIT 66MHZ 196-MAPBGA

MCF5272CVF66

Manufacturer Part Number
MCF5272CVF66
Description
IC MPU 32BIT 66MHZ 196-MAPBGA
Manufacturer
Freescale Semiconductor
Series
MCF527xr
Datasheets

Specifications of MCF5272CVF66

Core Processor
Coldfire V2
Core Size
32-Bit
Speed
66MHz
Connectivity
EBI/EMI, Ethernet, I²C, SPI, UART/USART, USB
Peripherals
DMA, WDT
Number Of I /o
32
Program Memory Size
16KB (4K x 32)
Program Memory Type
ROM
Ram Size
1K x 32
Voltage - Supply (vcc/vdd)
3 V ~ 3.6 V
Oscillator Type
External
Operating Temperature
-40°C ~ 85°C
Package / Case
196-MAPBGA
Family Name
MCF5xxx
Device Core
ColdFire
Device Core Size
32b
Frequency (max)
66MHz
Instruction Set Architecture
RISC
Supply Voltage 1 (typ)
3.3V
Operating Temp Range
-40C to 85C
Operating Temperature Classification
Industrial
Mounting
Surface Mount
Pin Count
196
Package Type
MA-BGA
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Eeprom Size
-
Data Converters
-
Lead Free Status / Rohs Status
Not Compliant

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21.3
The TAP controller is a synchronous state machine that controls JTAG logic and interprets the sequence
of logical values on TMS. The value adjacent to each arrow in the state machine in
the value of TMS sampled on the rising edge of TCK. For a description of the TAP controller states, refer
to the IEEE 1149.1 document.
Freescale Semiconductor
MTMOD
TDI/DSI
DSCLK
Signal
TRST/
TAP Controller
Test and debug data in. Input provided for loading serial data port shift registers (boundary-scan, bypass, and
instruction registers). Shifting in of data depends on the state of the JTAG controller state machine and the
instruction currently in the instruction register. Data is shifted in on the rising edge of TCK.
JTAG test reset. TRST asynchronously resets the JTAG TAP logic when low.
Freescale test mode select. Negating MTMOD enables JTAG mode; asserting it enables BDM mode.
MCF5272 ColdFire
Figure 21-2. TAP Controller State Machine
Table 21-1. JTAG Signals (continued)
®
Integrated Microprocessor User’s Manual, Rev. 3
Description
IEEE 1149.1 Test Access Port (JTAG)
Figure 21-2
reflects
21-3

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