pef20324 Infineon Technologies Corporation, pef20324 Datasheet - Page 57

• Manufacturer Part Number: pef20324
• Description: Multichannel Network Interface Controller With 128 Channels Extended
• Manufacturer: Infineon Technologies Corporation

6
6.1
In the MUNICH128X a Test Access Port (TAP) controller is implemented. The essential
part of the TAP is a finite state machine (16 states) controlling the different operational
modes of the boundary scan. Both, TAP controller and boundary scan, meet the
requirements given by the JTAG standard: IEEE 1149.1. Figure 6-1 gives an overview.
Figure 6-1
If no boundary scan operation is planned TRST has to be connected with V
TDI do not need to be connected since pull-up transistors ensure high input levels in this
case. Nevertheless it would be a good practice to put the unused inputs to defined levels.
In this case, if the JTAG is not used:
TMS = TCK = ’1’ is recommended.
Test handling (boundary scan operation) is performed via the pins TCK (Test Clock),
TMS (Test Mode Select), TDI (Test Data Input) and TDO (Test Data Output) when the
TAP controller is not in its reset state, i.e. TRST is connected to V
unconnected due to its internal pull-up. Test data at TDI are loaded with a 4-MHz clock
Hardware Reference Manual
Test Modes
Boundary Scan Unit
Block Diagram of Test Access Port and Boundary Scan
TCK
TRST
TMS
TDI
TDO Enable
CLOCK
Test
Control
Reset
Data in
Data out
Test Access Port
- Finite State Machine
- Instruction Register (3 bit)
- Test Signal Generator
Clock Generation
TAP Controller
CLOCK
57
ID Data out
Control
Bus
SS Data
out
6
DD
2
1
n
or it remains
Pins
PEB 20324
PEF 20324
Test Modes
SS
.
.
.
.
.
.
. TMS and
04.99