SE98ATP,547 NXP Semiconductors, SE98ATP,547 Datasheet

IC TEMP SENSOR DDR 8-HWSON

SE98ATP,547

Manufacturer Part Number
SE98ATP,547
Description
IC TEMP SENSOR DDR 8-HWSON
Manufacturer
NXP Semiconductors
Datasheet

Specifications of SE98ATP,547

Function
Temp Monitoring System (Sensor)
Topology
ADC (Sigma Delta), Register Bank
Sensor Type
Internal
Sensing Temperature
-40°C ~ 125°C
Output Type
I²C™/SMBus™
Output Alarm
Yes
Output Fan
Yes
Voltage - Supply
1.7 V ~ 3.6 V
Operating Temperature
-40°C ~ 125°C
Mounting Type
Surface Mount
Package / Case
8-WSON (Exposed Pad), 8-HWSON
Temperature Threshold
Programmable
Full Temp Accuracy
+/- 1 C
Digital Output - Bus Interface
2-Wire, SMBus, I2C
Digital Output - Number Of Bits
11
Supply Voltage (max)
3.6 V
Supply Voltage (min)
1.7 V
Description/function
DDR Memory Module Temperature Sensor
Maximum Operating Temperature
+ 125 C
Minimum Operating Temperature
- 40 C
Supply Current
250 uA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
568-4731-2
SE98ATP,147
1. General description
2. Features
The NXP Semiconductors SE98A measures temperature from −40 °C and +125 °C with
JEDEC Grade B ±1 °C accuracy between +75 °C and +95 °C communicating via the
I
measuring the DRAM temperature in accordance with the new JEDEC (JC-42.4) Mobile
Platform Memory Module Thermal Sensor Component specification.
The SE98A thermal sensor operates over the V
does not include the 2 k SPD and is designed for custom DIMM where larger SPD is
required.
The Temp Sensor (TS) consists of an Analog-to-Digital Converter (ADC) that monitors
and updates its own temperature readings 8 times per second, converts the reading to a
digital data, and latches them into the data temperature registers. User-programmable
registers, such as Shutdown or Low-power modes and the specification of temperature
event and critical output boundaries, provide flexibility for DIMM temperature-sensing
applications.
When the temperature changes beyond the specified boundary limits, the SE98A outputs
an EVENT signal using an open-drain output that can be pulled up between 0.9 V and
3.6 V. The user has the option of setting the EVENT output signal polarity as either an
active LOW or active HIGH comparator output for thermostat operation, or as a
temperature event interrupt output for microprocessor-based systems. The EVENT output
can even be configured as a critical temperature output.
The SE98A supports the industry-standard 2-wire I
SMBus TIMEOUT function is supported to prevent system lock-ups. Manufacturer and
Device ID registers provide the ability to confirm the identify of the device. Three address
pins allow up to eight devices to be controlled on a single bus.
The SE98A is an improved SE98 and is comparable to the thermal sensor in the SE97 but
with voltage range of 1.7 V to 3.6 V.
2
C-bus/SMBus. It is typically mounted on a Dual In-Line Memory Module (DIMM)
SE98A
DDR memory module temp sensor, 1.7 V to 3.6 V
Rev. 04 — 25 November 2009
JEDEC (JC-42.4) TS3000B1 DIMM ± 0.5 °C (typ.) between 75 °C and 95 °C
temperature sensor
Optimized for voltage range: 1.7 V to 3.6 V
Shutdown current: 0.1 μA (typ.) and 5.0 μA (max.)
2-wire interface: I
SMBus ALERT and TIMEOUT (programmable)
11-bit ADC Temperature-to-Digital converter with 0.125 °C resolution
2
C-bus/SMBus compatible, 0 Hz to 400 kHz
DD
range of 1.7 V to 3.6 V. The SE98A
2
C-bus/SMBus serial interface. The
Product data sheet

Related parts for SE98ATP,547

SE98ATP,547 Summary of contents

Page 1

... SE98A DDR memory module temp sensor, 1 3.6 V Rev. 04 — 25 November 2009 1. General description The NXP Semiconductors SE98A measures temperature from −40 °C and +125 °C with JEDEC Grade B ±1 °C accuracy between +75 °C and +95 °C communicating via the 2 I C-bus/SMBus typically mounted on a Dual In-Line Memory Module (DIMM) measuring the DRAM temperature in accordance with the new JEDEC (JC-42 ...

Page 2

... NXP Semiconductors Operating current: 250 μA (typ.) and 400 μA (max.) Programmable hysteresis threshold: 0 °C, 1.5 °C, 3 °C, 6 °C Over/under/critical temperature EVENT output B grade accuracy: ±0.5 °C/±1 °C (typ./max.) → +75 °C to +95 °C ±1 °C/±2 °C (typ./max.) → +40 °C to +125 °C ± ...

Page 3

... NXP Semiconductors 5. Block diagram SE98A TEMPERATURE REGISTER CRITICAL ALARM TRIP UPPER ALARM TRIP LOWER ALARM TRIP CAPABILITY MANUFACTURING ID DEVICE/REV ID SMBus TIMEOUT/ALERT CONFIGURATION • HYSTERESIS • SHUT DOWN TEMP SENSOR • LOCK PROTECTION • EVENT OUTPUT ON/OFF • EVENT OUTPUT POLARITY • EVENT OUTPUT STATUS • ...

Page 4

... NXP Semiconductors 6. Pinning information 6.1 Pinning Fig 2. Pin configuration for TSSOP8 Fig 4. Pin configuration for HXSON8 6.2 Pin description Table 2. Symbol [ SDA SCL EVENT V DD [1] This input is overvoltage tolerant to support software write protection when applied to SPD. SE98A_4 Product data sheet DDR memory module temp sensor, 1 3.6 V ...

Page 5

... NXP Semiconductors 7. Functional description 7.1 Serial bus interface The SE98A uses the 2-wire serial bus (I controller. The serial bus consists of a clock (SCL) and data (SDA) signals. The device can operate on either the I Standard-mode is defined to have bus speeds from 100 kHz, I from 400 kHz, and the SMBus is from 10 kHz to 100 kHz ...

Page 6

... NXP Semiconductors 7.3 EVENT output condition The EVENT output indicates conditions such as the temperature crossing a predefined boundary. The EVENT modes are very configurable and selected using the configuration register (CONFIG). The interrupt mode or comparator mode is selected using CONFIG[0], using either TCRIT/UPPER/LOWER or TCRIT only temperature bands (CONFIG[2]) as modified by hysteresis (CONFIG[10:9]) ...

Page 7

... NXP Semiconductors temperature (°C) critical Upper Boundary Alarm Lower Boundary Alarm EVENT in Comparator mode EVENT in Interrupt mode software interrupt clear EVENT in ‘Critical Temp only’ mode Refer to Table 3 for figure note information. Fig 6. EVENT output condition Table 3. EVENT output condition Figure ...

Page 8

... NXP Semiconductors 7.3.2 EVENT thresholds 7.3.2.1 Alarm window The device provides a comparison window with an UPPER trip point and a LOWER trip point, programmed through the Upper Boundary Alarm Trip register (02h), and Lower Boundary Alarm Trip register (03h). The Upper Boundary Alarm Trip register holds the ...

Page 9

... NXP Semiconductors 7.3.2.2 Critical trip The T th(crit) modified by hysteresis as programmed in the Configuration register. When the temperature reaches the critical temperature value in this register (and EVENT is enabled), the EVENT output asserts and cannot be de-asserted until the temperature drops below the critical temperature threshold. The EVENT cannot be cleared through the Clear EVENT bit (CEVNT) or SMBus ALERT ...

Page 10

... NXP Semiconductors In interrupt mode, EVENT asserts when the temperature crosses the alarm upper boundary. If the EVENT output is cleared and the temperature continues to increase until it crosses the critical temperature threshold, EVENT asserts again. Because the temperature is greater than the critical temperature threshold, a Clear EVENT command does not clear the EVENT output ...

Page 11

... NXP Semiconductors 7.5 Power-up default condition After power-on, the SE98A is initialized to the following default condition: • Starts monitoring local sensor • EVENT register is cleared—EVENT output is pulled HIGH by external pull-ups EVENT hysteresis is defaulted to 0 °C • • Command pointer is defaulted to ‘00h’ ...

Page 12

... NXP Semiconductors 7.7 SMBus Time-out The SE98A supports the SMBus time-out feature. If the host holds SCL LOW between 25 ms and 35 ms, the SE98A would reset its internal state machine to the bus idle state to prevent the system bus hang-up. This feature is turned on by default. The SMBus time-out is disabled by writing a logic 1 to bit 7 of register 22h ...

Page 13

... NXP Semiconductors 7.9 SMBus/I The data registers in this device are selected by the Pointer register. At power-up, the Pointer register is set to ‘00’, the location for the Capability register. The Pointer register latches the last location it was set to. Each data register falls into one of three types of user accessibility: • ...

Page 14

... NXP Semiconductors SCL SDA S START device address and write by host SCL D15 D14 D13 D12 SDA by host most significant byte data A = ACK = Acknowledge bit Write bit = Read bit = 1. 2 Fig 9. SMBus/I C-bus write to the Pointer register followed by a write data word ...

Page 15

... NXP Semiconductors SCL SDA S START device address and read by host SCL D15 D14 D13 D12 SDA returned most significant byte data A = ACK = Acknowledge bit Not Acknowledge bit Write bit = Read bit = 1. 2 Fig 11. SMBus/I C-bus word read from register with a pre-set pointer 7 ...

Page 16

... NXP Semiconductors 8. Register descriptions 8.1 Register overview This section describes all the registers used in the SE98A. The registers are used for latching the temperature reading, storing the low and high temperature limits, configuring, the hysteresis threshold and the ADC, as well as reporting status. The device uses the Pointer register to access these registers ...

Page 17

... NXP Semiconductors 8.2 Capability register (00h, 16-bit read-only) Table 6. Capability register (address 00h) bit allocation Bit 15 14 Symbol Reset 0 0 Access R R Bit 7 6 Symbol RFU[1:0] Reset 0 0 Access R R Table 7. Bit 15 SE98A_4 Product data sheet DDR memory module temp sensor, 1 3.6 V ...

Page 18

... NXP Semiconductors 8.3 Configuration register (01h, 16-bit read/write) Table 8. Configuration register (address 01h) bit allocation Bit 15 14 Symbol Default 0 0 Access R R Bit 7 6 Symbol CTLB AWLB Default 0 0 Access R/W R/W Table 9. Bit Symbol 15:11 RFU 10:9 HEN 8 SHMD SE98A_4 Product data sheet DDR memory module temp sensor, 1 ...

Page 19

... NXP Semiconductors Table 9. Bit Symbol 7 CTLB 6 AWLB 5 CEVNT 4 ESTAT 3 EOCTL 2 CVO SE98A_4 Product data sheet DDR memory module temp sensor, 1 3.6 V Configuration register (address 01h) bit description Description Critical Trip Lock bit. 0 — Critical Alarm Trip register is not locked and can be altered (default). ...

Page 20

... NXP Semiconductors Table 9. Bit Symbol EMD Table 10. Hysteresis enable Action Below Alarm Window bit (bit 13) Temperature Threshold slope temperature − T sets falling T trip(l) clears rising T trip(l) critical alarm upper alarm lower alarm Above Critical Trip bit 15 = ACT bit) Above Alarm Window ...

Page 21

... NXP Semiconductors 8.4 Temperature format The 16-bit value used in the following Trip Point Set and Temperature Read-Back registers is 2’s complement with the Least Significant Bit (LSB) equal to 0.0625 °C. For example: A value of 019Ch will represent 25.75 °C • A value of 07C0h will represent 124 °C • ...

Page 22

... NXP Semiconductors 8.5 Temperature Trip Point registers 8.5.1 Upper Boundary Alarm Trip register (16-bit read/write) The value is the upper threshold temperature value for Alarm mode. The data format is 2’s complement with bit 2 = 0.25 °C. ‘RFU’ bits will always report zero. Interrupts will respond to the presently programmed boundary values ...

Page 23

... NXP Semiconductors 8.5.2 Lower Boundary Alarm Trip register (16-bit read/write) The value is the lower threshold temperature value for Alarm mode. The data format is 2’s complement with bit 2 = 0.25 °C. RFU bits will always report zero. Interrupts will respond to the presently programmed boundary values. If boundary values are being altered in-system advised to turn off interrupts until a known state can be obtained to avoid superfluous interrupt activity ...

Page 24

... NXP Semiconductors 8.6 Temperature register (16-bit read-only) Table 18. Bit Symbol Reset Access Bit Symbol Reset Access Table 19. Bit 11:1 0 SE98A_4 Product data sheet DDR memory module temp sensor, 1 3.6 V Temperature register bit allocation ACT AAW BAW SIGN TEMP[6: Temperature register bit description ...

Page 25

... NXP Semiconductors 8.7 Manufacturer’s ID register (16-bit read-only) The manufacture’s ID matches that assigned to NXP Semiconductors PCI-SIG (1131h), and is intended for use to identify the manufacturer of the device. Table 20. Bit Symbol Reset Access Bit Symbol Reset Access 8.8 Device ID register The device ID and device revision are A1h and 02h, respectively. ...

Page 26

... NXP Semiconductors 8.9 SMBus register Table 22. Bit Symbol Reset Access Bit Symbol Reset Access Table 23. Bit 15:8 7 6:1 0 SE98A_4 Product data sheet DDR memory module temp sensor, 1 3.6 V SMBus Time-out register bit allocation STMOUT R SMBus Time-out register bit description Symbol Description RFU reserved ...

Page 27

... NXP Semiconductors 9. Application design-in information In a typical application, the SE98A behaves as a slave device and interfaces to the master (or host) via the SCL and SDA lines. The host monitors the EVENT output pin, which is asserted when the temperature reading exceeds the programmed values in the alarm registers. The A0, A1 and A2 pins are directly connected to the shared SPD’ ...

Page 28

... NXP Semiconductors 9.1 SE98A in memory module application Figure 15 SPD. The SE98A is centered in the memory module to provide the function to monitor the temperature of the DRAM. In the event of overheat, the SE98A triggers the EVENT output and the memory controller can throttle the memory bus to slow the DRAM, or the CPU can increase the refresh rate for the DRAM ...

Page 29

... NXP Semiconductors I OL(sink)(SDA) I OL(sink)EVENT 10. Limiting values Table 24. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter V supply voltage DD V voltage on any other pin n V voltage on pin sink current sink T maximum junction temperature j(max) T storage temperature stg 11 ...

Page 30

... NXP Semiconductors Table 26. SMBus DC characteristics − ° 1 3 +120 DD amb Symbol Parameter V HIGH-level input voltage IH V LOW-level input voltage IL V overvoltage input voltage I(ov) V HIGH-level power-on reset th(POR)H threshold voltage V power-on reset recovery th(rec)POR threshold voltage I LOW-level output sink current on OL(sink)EVENT ...

Page 31

... NXP Semiconductors 5 I sd(VDD) (μ 3 −1 − C-bus and temp sensor inactive. Fig 17. Shutdown supply current 30 I OL(sink)EVENT (mA 3 3.0 V 2 −50 − 0 Fig 19. EVENT output current 15 conversion rate (conv/ − Fig 21. Conversion rate SE98A_4 Product data sheet DDR memory module temp sensor, 1 3.6 V 002aad881 3 ...

Page 32

... NXP Semiconductors 3 (V) 2.5 2.0 1.5 1.0 − For temp sensor conversion. Fig 23. Average power-on threshold voltage temp error (˚ 150 mV (p-p); 0.1 μF AC coupling capacitor; no decoupling capacitor Fig 25. Temperature error versus power supply noise frequency 3 (μ 3.0 V 2 ...

Page 33

... NXP Semiconductors Table 27. SMBus AC characteristics − ° 1 3 +125 DD amb The AC specifications fully meet or exceed SMBus 2.0 specifications, but allow the bus to interface with the I to 400 kHz. Symbol Parameter f SCL clock frequency SCL t HIGH period of the SCL clock HIGH t LOW period of the SCL clock ...

Page 34

... NXP Semiconductors t LOW SCL t t HD;STA BUF SDA P S SCL t SU;STO SDA STOP condition S = START condition P = STOP condition Fig 27. AC waveforms SE98A_4 Product data sheet DDR memory module temp sensor HIGH SU;STA t t HD;DAT SU;DAT t W write cycle Rev. 04 — 25 November 2009 ...

Page 35

... NXP Semiconductors 12. Package outline TSSOP8: plastic thin shrink small outline package; 8 leads; body width 4 pin 1 index 1 e DIMENSIONS (mm are the original dimensions UNIT max. 0.15 0.95 mm 1.1 0.25 0.05 0.85 Notes 1. Plastic or metal protrusions of 0.15 mm maximum per side are not included. ...

Page 36

... NXP Semiconductors HWSON8: plastic thermal enhanced very very thin small outline package; no leads; 8 terminals; body 0 terminal 1 index area terminal 1 e index area Dimensions (1) Unit max 0.80 0.05 0.65 0.30 mm nom 0.75 0.02 0.55 0.2 0.25 min 0.70 0.00 0.45 0.18 Note 1 ...

Page 37

... NXP Semiconductors HXSON8: plastic thermal enhanced extremely thin small outline package; no leads; 8 terminals; body 0 terminal 1 index area terminal 1 e index area DIMENSIONS (mm are the original dimensions) (1) UNIT max 0.5 0.04 0.3 2.1 mm nom 2.0 min 0.2 1.9 Note 1. Dimension A is including plating thickness. The package footprint is compatible with JEDEC MO229 ...

Page 38

... NXP Semiconductors 13. Soldering of SMD packages This text provides a very brief insight into a complex technology. A more in-depth account of soldering ICs can be found in Application Note AN10365 “Surface mount reflow soldering description”. 13.1 Introduction to soldering Soldering is one of the most common methods through which packages are attached to Printed Circuit Boards (PCBs), to form electrical circuits ...

Page 39

... NXP Semiconductors 13.4 Reflow soldering Key characteristics in reflow soldering are: • Lead-free versus SnPb soldering; note that a lead-free reflow process usually leads to higher minimum peak temperatures (see reducing the process window • Solder paste printing issues including smearing, release, and adjusting the process window for a mix of large and small components on one board • ...

Page 40

... NXP Semiconductors temperature MSL: Moisture Sensitivity Level Fig 31. Temperature profiles for large and small components For further information on temperature profiles, refer to Application Note AN10365 “Surface mount reflow soldering description”. 14. Abbreviations Table 30. Acronym ADC ARA BIOS CDM CMOS CPU CRWP DDR ...

Page 41

... NXP Semiconductors Table 30. Acronym RDIMM SO-DIMM PC POR RWP SMBus SPD 15. Revision history Table 31. Revision history Document ID Release date SE98A_4 20091125 • Modifications: Table 1 “Ordering “SOT1069-1” to “SOT1069-2” • Figure 29: package outline drawing changed from “SOT1069-1” to “SOT1069-2” SE98A_3 20090817 ...

Page 42

... Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice ...

Page 43

... NXP Semiconductors 18. Contents 1 General description . . . . . . . . . . . . . . . . . . . . . . 1 2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 3 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 4 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 5 Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . 3 6 Pinning information . . . . . . . . . . . . . . . . . . . . . . 4 6.1 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 6.2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 4 7 Functional description . . . . . . . . . . . . . . . . . . . 5 7.1 Serial bus interface . . . . . . . . . . . . . . . . . . . . . . 5 7.2 Slave address . . . . . . . . . . . . . . . . . . . . . . . . . . 5 7.3 EVENT output condition . . . . . . . . . . . . . . . . . . 6 7.3.1 EVENT pin output voltage levels and resistor sizing ...

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