SE98ATP,547 NXP Semiconductors, SE98ATP,547 Datasheet - Page 10
![IC TEMP SENSOR DDR 8-HWSON](/photos/7/49/74936/se98atp_147_sml.jpg)
SE98ATP,547
Manufacturer Part Number
SE98ATP,547
Description
IC TEMP SENSOR DDR 8-HWSON
Manufacturer
NXP Semiconductors
Datasheet
1.SE98ATP547.pdf
(43 pages)
Specifications of SE98ATP,547
Function
Temp Monitoring System (Sensor)
Topology
ADC (Sigma Delta), Register Bank
Sensor Type
Internal
Sensing Temperature
-40°C ~ 125°C
Output Type
I²C™/SMBus™
Output Alarm
Yes
Output Fan
Yes
Voltage - Supply
1.7 V ~ 3.6 V
Operating Temperature
-40°C ~ 125°C
Mounting Type
Surface Mount
Package / Case
8-WSON (Exposed Pad), 8-HWSON
Temperature Threshold
Programmable
Full Temp Accuracy
+/- 1 C
Digital Output - Bus Interface
2-Wire, SMBus, I2C
Digital Output - Number Of Bits
11
Supply Voltage (max)
3.6 V
Supply Voltage (min)
1.7 V
Description/function
DDR Memory Module Temperature Sensor
Maximum Operating Temperature
+ 125 C
Minimum Operating Temperature
- 40 C
Supply Current
250 uA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
568-4731-2
SE98ATP,147
SE98ATP,147
NXP Semiconductors
SE98A_4
Product data sheet
7.4.1 What temperature is read when conversion is in progress
7.4 Conversion rate
In interrupt mode, EVENT asserts when the temperature crosses the alarm upper
boundary. If the EVENT output is cleared and the temperature continues to increase until
it crosses the critical temperature threshold, EVENT asserts again. Because the
temperature is greater than the critical temperature threshold, a Clear EVENT command
does not clear the EVENT output. Once the temperature drops below the critical
temperature, EVENT de-asserts immediately.
The conversion time is the amount of time required for the ADC to complete a
temperature measurement for the local temperature sensor. The conversion rate is the
inverse of the conversion period which describes the number of cycles the temperature
measurement completes in one second—the faster the conversion rate, the faster the
temperature reading is updated. The SE98A’s conversion rate is at least 8 Hz or 125 ms.
The SE98A has been designed to ensure a valid temperature is always available. When a
read to the temperature register is initiated through the SMBus, the device checks to see if
the temperature conversion process (Analog-to-Digital conversion) is complete and a new
temperature is available:
It is possible that while the SMBus Master is reading the temperature register, a new
temperature conversion completes. However, this will not affect the data (MSB or LSB)
that is being shifted out. On the next read of the temperature register the new temperature
value will be shifted out.
•
•
•
Advisory notification:
– NXP device: If the EVENT output is not cleared before the temperature goes
– Competitor devices: If the EVENT output is not cleared before or when the
– Work-around: Always clear the EVENT output before temperature exceeds the
– SE98B will keep EVENT asserted after the temperature drops below the critical
If the temperature conversion process is complete, then the new temperature value is
sent out on the SMBus.
If the temperature conversion process in not complete, then the previous temperature
value is sent out on the SMBus.
above the critical temperature threshold EVENT de-asserts immediately when
temperature drops below the critical temperature.
temperature is in the critical temperature threshold, EVENT will remain asserted
after the temperature drops below the critical temperature until a Clear EVENT
command.
critical temperature.
temperature until a Clear EVENT command de-asserts EVENT.
Rev. 04 — 25 November 2009
DDR memory module temp sensor, 1.7 V to 3.6 V
© NXP B.V. 2009. All rights reserved.
SE98A
10 of 43