MC812A4CPVE8 Freescale Semiconductor, MC812A4CPVE8 Datasheet - Page 225

IC MCU 16BIT EEPROM 4K 112-LQFP

MC812A4CPVE8

Manufacturer Part Number
MC812A4CPVE8
Description
IC MCU 16BIT EEPROM 4K 112-LQFP
Manufacturer
Freescale Semiconductor
Series
HC12r
Datasheet

Specifications of MC812A4CPVE8

Core Processor
CPU12
Core Size
16-Bit
Speed
8MHz
Connectivity
SCI, SPI
Peripherals
POR, WDT
Number Of I /o
83
Program Memory Size
4KB (4K x 8)
Program Memory Type
EEPROM
Ram Size
1K x 8
Voltage - Supply (vcc/vdd)
4.5 V ~ 5.5 V
Data Converters
A/D 8x8b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
112-LQFP
Processor Series
HC812A
Core
HC12
Data Bus Width
16 bit
Data Ram Size
1 KB
Interface Type
SCI, SPI
Maximum Clock Frequency
8 MHz
Number Of Programmable I/os
91
Number Of Timers
8
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
On-chip Adc
8 bit, 8 Channel
Controller Family/series
68HC12
No. Of I/o's
91
Eeprom Memory Size
4KB
Ram Memory Size
1KB
Cpu Speed
8MHz
No. Of Timers
1
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
 Details

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18.7 ATD DC Electrical Characteristcs
18.8 Analog Converter Operating Characteristics
Freescale Semiconductor
Analog supply voltage
Analog supply current, normal operation
Reference voltage, low
Reference voltage, high
V
Input voltage
Input current, off channel
Reference supply current
Input capacitance
8-bit resolution
Differential non-linearity
Integral non-linearity
Absolute error
Maximum source impedance
1. V
2. Accuracy is guaranteed at V
3. To obtain full-scale, full-range results, V
4. Maximum leakage occurs at maximum operating temperature. Current decreases by approximately one-half for each
1. V
2. V
3. At V
4. 8-bit absolute error of 1 count (20 mV) includes 1/2 count (10 mv) inherent quantization error and 1/2 count (10 mV) circuit
5. Maximum source impedance is application-dependent. Error resulting from pin leakage depends on junction leakage into
REF
Not sampling
Sampling
2, 4, 8, and 16 ATD sample clocks
10°C decrease from maximum temperature.
(differential, integral, and offset) error.
the pin and on leakage due to charge-sharing with internal capacitance.
Error from junction leakage is a function of external source impedance and input leakage current. Expected error in result
value due to junction leakage is expressed in voltage (V
where I
clock speed, the number of channels being scanned, and source impedance. For 8-bit conversions, charge pump leakage
is computed as follows:
DD
DD
RH
differential reference voltage
−V
REF
= 5.0 Vdc ± 10%, V
= 5.0 Vdc ± 10%, V
RL
= 5.12 V, one 8-bit count = 20 mV.
OFF
(3)
≥ 5.12 V; V
(3),(4)
(2)
is a function of operating temperature. Charge-sharing effects with internal capacitors are a function of ATD
(3)
Characteristic
(3)
DDA
(4)
SS
SS
—V
Characteristic
= 0 Vdc, T
= 0 Vdc, T
RH
SSA
(2)
V
− V
ERRJ
= 5.12 V
(1)
RL
A
A
=
= .25 pF × V
= T
= T
5.0 Vdc ± 10%
SSA
MC68HC812A4 Data Sheet, Rev. 7
(1)
L
L
≤ V
to T
to T
RL
H
H
, ATD clock = 2 MHz, unless otherwise noted
, ATD clock = 2 MHz, unless otherwise noted
DDA
≤ V
INDC
V
× R
.
ERRJ
ERRJ
S
≤ V
× ATDCLK/(8 × number of channels)
):
= R
2 counts
Symbol
RH
DNL
INL
AE
R
S
≤ V
S
× I
DDA
OFF
.
−0.5
Min
V
−1
−2
Symbol
RH
V
V
C
C
I
I
I
V
V
DDA
INDC
OFF
REF
DDA
INN
INS
RH
−V
RL
RL
ATD DC Electrical Characteristcs
Typical
24
20
V
V
V
DDA
Min
4.5
4.5
SSA
SSA
/2
See note
Max
+0.5
V
+1
+2
V
V
Max
DDA
100
250
5.5
1.0
5.5
10
15
DDA
DDA
(5)
/2
Count
Count
Count
Unit
Unit
mV
mA
kΩ
nA
µA
pF
V
V
V
V
V
225

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