LIS302DLTR STMicroelectronics, LIS302DLTR Datasheet - Page 10

ACCELEROMETER 3AXIS MEMS 14-LGA

LIS302DLTR

Manufacturer Part Number
LIS302DLTR
Description
ACCELEROMETER 3AXIS MEMS 14-LGA
Manufacturer
STMicroelectronics
Datasheet

Specifications of LIS302DLTR

Featured Product
STM32 Cortex-M3 Companion Products
Axis
X, Y, Z
Acceleration Range
±2.3g, 9.2g
Sensitivity
18mg/digit, 72mg/digit
Voltage - Supply
2.16 V ~ 3.6 V
Output Type
Digital
Bandwidth
100Hz ~ 400Hz Selectable
Interface
I²C, SPI
Mounting Type
Surface Mount
Package / Case
14-LGA
Sensing Axis
X, Y, Z
Acceleration
2 g, 8 g
Digital Output - Number Of Bits
8 bit
Supply Voltage (max)
3.6 V
Supply Voltage (min)
2.16 V
Supply Current
0.3 mA
Maximum Operating Temperature
+ 85 C
Minimum Operating Temperature
- 40 C
Digital Output - Bus Interface
I2C, SPI
Shutdown
Yes
For Use With
497-9047 - BOARD DEMO ACCELEROMETER DIL24497-8373 - BOARD EVAL EXTENSION SN250497-8204 - BOARD ADAPTER LIS302SG DIL24497-8203 - BOARD DEMO LIS302SG497-6404 - BOARD EVAL SPZB260 MOD FOR STR9497-6342 - BOARD EVALUATION FOR LIS302DL497-6246 - BOARD EVAL ACCELEROM LIS302ALK497-6227 - BOARD ADAPTER 20DIP LIS3LV02DL497-6226 - BOARD EVAL ACCELEROM LIS3LV02DL
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
497-5911-2

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
LIS302DLTR
Manufacturer:
ST
Quantity:
1 056
Part Number:
LIS302DLTR
Manufacturer:
ST
Quantity:
20 000
Company:
Part Number:
LIS302DLTR
Quantity:
12 000
Part Number:
LIS302DLTR-B1
Manufacturer:
ST
0
Part Number:
LIS302DLTR.
Manufacturer:
ST
0
Part Number:
LIS302DLTR/
Manufacturer:
ST
0
Part Number:
LIS302DLTR/302D
Manufacturer:
ST
0
Part Number:
LIS302DLTR8
Manufacturer:
SONY
Quantity:
26
Part Number:
LIS302DLTR8
Manufacturer:
ST
0
Part Number:
LIS302DLTR8
Manufacturer:
ST
Quantity:
20 000
Mechanical and electrical specifications
2
2.1
Table 3.
1. The product is factory calibrated at 2.5V. The device can be used from 2.16V to 3.6V
2. Typical specifications are not guaranteed
3. Verified by wafer level test and measurement of initial offset and sensitivity
4. Typical zero-g level offset value after MSL3 preconditioning
5. Offset can be eliminated by enabling the built-in high pass filter
6. If STM bit is used values change in sign for all axes
7. Self Test output changes with the power supply. Vst at 3.3V is typically in the range [-74; -7] LSb for X axis and [7;74] LSb for Y
8.
9. Output data reach 99% of final value after 3/ODR when enabling Self-Test mode due to device filtering
10. ODR is output data rate. Refer to
10/42
Symbol
TCSO
TCOff
TyOff
and Z axes.
1LSb=4.6g/256 at 8bit representation, ±2.3g Full-Scale
“Self Test Output Change” is defined as OUTPUT[LSb]
BW
Top
Wh
Vst
FS
So
Measurement range
Sensitivity
Sensitivity change vs
temperature
Typical zero-g level offset
accuracy
Zero-g level change vs
temperature
Self test output
change
System bandwidth
Operating temperature range
Product weight
Mechanical and electrical specifications
Mechanical characteristics
Mechanical characteristics
(All the parameters are specified @ Vdd=2.5 V, T = 25°C unless otherwise noted)
(6),(7),(8),(9)
(4),(5)
Parameter
(10)
(3)
Table 4
for specifications
FS bit set to 0
FS bit set to 1
FS bit set to 0
FS bit set to 1
FS bit set to 0
FS bit set to 0
FS bit set to 1
Max delta from 25°C
FS bit set to 0
STP bit used
X axis
FS bit set to 0
STP bit used
Y axis
FS bit set to 0
STP bit used
Z axis
(1)
Test conditions
(Self-test bit on ctrl_reg1=1)
-OUTPUT[LSb]
Min.
±2.0
±8.0
16.2
64.8
-32
-40
3
3
(Self-test bit on ctrl_reg1=0)
Typ.
ODR/2
±0.01
±2.3
±9.2
±0.5
±40
±60
18
72
30
(2)
Max.
19.8
79.2
+85
32
32
-3
.
LIS302DL
mg/digit
mgram
mg/°C
%/°C
Unit
LSb
LSb
LSb
mg
mg
Hz
°C
g

Related parts for LIS302DLTR