ADC08D1000DEV NSC [National Semiconductor], ADC08D1000DEV Datasheet - Page 13

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ADC08D1000DEV

Manufacturer Part Number
ADC08D1000DEV
Description
High Performance, Low Power, Dual 8-Bit, 1 GSPS A/D Converter
Manufacturer
NSC [National Semiconductor]
Datasheet
Note 8: Typical figures are at T
= 25°C, and represent most likely parametric norms. Test limits are guaranteed to National's AOQL (Average Outgoing Quality
A
Level).
Note 9: Calculation of Full-Scale Error for this device assumes that the actual reference voltage is exactly its nominal value. Full-Scale Error for this device,
therefore, is a combination of Full-Scale Error and Reference Voltage Error. See Figure 2. For relationship between Gain Error and Full-Scale Error, see
Specification Definitions for Gain Error.
Note 10: The analog and clock input capacitances are die capacitances only. Additional package capacitances of 0.65 pF differential and 0.95 pF each pin to
ground are isolated from the die capacitances by lead and bond wire inductances.
Note 11: This parameter is guaranteed by design and is not tested in production.
Note 12: This parameter is guaranteed by design and/or characterization and is not tested in production.
Note 13: The digital control pin capacitances are die capacitances only. Additional package capacitance of 1.6 pF each pin to ground are isolated from the die
capacitances by lead and bond wire inductances.
Note 14: Each of the two converters of the ADC08D1000 has two LVDS output buses, which each clock data out at one half the sample rate. The data at each
bus is clocked out at one half the sample rate. The second bus (D0 through D7) has a pipeline latency that is one Input Clock cycle less than the latency of the
first bus (Dd0 through Dd7).
Note 15: Tying V
to the supply rail will increase the output offset voltage (V
) by 400mv (typical), as shown in the V
specification above. Tying V
to the
BG
OS
OS
BG
supply rail will also affect the differential LVDS output voltage (V
), causing it to increase by 40mV (typical).
OD
13
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