S9S12G96F0CLL Freescale Semiconductor, S9S12G96F0CLL Datasheet - Page 1231

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S9S12G96F0CLL

Manufacturer Part Number
S9S12G96F0CLL
Description
16-bit Microcontrollers - MCU 16BIT 96K FLASH
Manufacturer
Freescale Semiconductor
Datasheet

Specifications of S9S12G96F0CLL

Rohs
yes
Core
S12
Processor Series
MC9S12G
Data Bus Width
16 bit
Maximum Clock Frequency
25 MHz
Program Memory Size
96 KB
Data Ram Size
8 KB
On-chip Adc
Yes
Operating Supply Voltage
5 V
Operating Temperature Range
- 40 C to + 85 C
Package / Case
LQFP-100
Mounting Style
SMD/SMT

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1
2
3
4
A.7.2
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The data retention and program/erase cycling failure rates are specified at the operating conditions noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
Freescale Semiconductor
Num C
12a
12b
10
11
Typical program and erase times are based on typical f
Maximum program and erase times are based on minimum f
t
Typical value for a new device
8
9
cyc
= 1 / f
D P-Flash sector erase time
D P-Flash phrase programming time
D EEPROM sector erase time
D EEPROM erase verify (blank check) time
D EEPROM one word programming time
D EEPROM two word programming time
(FTMRG240K2, TMRG192K2)
EEPROM erase verify (blank check) time
(FTMRG128K1, FTMRG96K1)
EEPROM erase verify (blank check) time
(FTMRG64K1, FTMRG48K1)
EEPROM erase verify (blank check) time
(FTMRG32K1, FTMRG16K1)
NVMBUS
NVM Reliability Parameters
Rating
MC9S12G Family Reference Manual, Rev.1.23
NVMOP
NVMOP
and maximum f
and maximum f
Symbol
t
t
t
t
t
t
t
dcheck
dcheck
dcheck
dcheck
dpgm1
dpgm2
t
t
ppgm
pera
dera
NVMBUS
Min
NVMBUS
Typ
185
140
20
97
5
4
1
Electrical Characteristics
Max
2620
2620
1540
1030
200
106
154
26
26
2
Unit
t
t
t
t
ms
ms
µs
µs
µs
cyc
cyc
cyc
cyc
1233
3

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