S1K50000 Epson Electronics America, Inc., S1K50000 Datasheet - Page 25

• Manufacturer Part Number: S1K50000
• Description: Design Guide S1k50000 Series
• Manufacturer: Epson Electronics America, Inc.

Chapter 2: Precautions on Circuit Design
20
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(3) Definition of the fault detection rate
The single-degeneracy fault mode is used.
The ATPG tool (TestGen) generates the test pattern shown below.
A test pattern is generated in such a way that SA1 and SA0 are set for each node and that,
when they are fixed to the observable logic level of 0 or 1, a functional failure results.
SA0: Fixed (shorted) to 0
SA1: Fixed (shorted) to 1
S-a-1
KOR2
Figure 2-7 Example of an Untestable Fault
EPSON
KIN1
D
C
D
C
KDF
KDF
XQ
XQ
Q
Q
STANDARD CELL S1K50000 SERIES
KAD2
DESIGN GUIDE
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