S1K50000 Epson Electronics America, Inc., S1K50000 Datasheet - Page 68

• Manufacturer Part Number: S1K50000
• Description: Design Guide S1k50000 Series
• Manufacturer: Epson Electronics America, Inc.

4.4.3 Test-Circuit Information
STANDARD CELL S1K50000 SERIES
DESIGN GUIDE
Customers are requested to provide the following information regarding a test circuit, as it is
necessary to test the functional cells during simulation and shipment inspection:
(1) Clearly indicate which pins of the function cells are connected to which pins of the IC in test
(2) If a test circuit is configured to allow multiple functional cells to be tested from a single test
(3) Particularly when using two or more of the same functional cell, assign the functional-cell
(4) Clearly indicate the method for switching to test mode.
mode.
pin, clearly indicate the relationship between the test mode and the selected functional-cell
names.
names a sequential number in the drawing, clearly indicating for which functional cell the
test pin is used.
EPSON
Chapter 4: Circuit Design Taking Testability into Account
63