S1K50000 Epson Electronics America, Inc., S1K50000 Datasheet - Page 63

• Manufacturer Part Number: S1K50000
• Description: Design Guide S1k50000 Series
• Manufacturer: Epson Electronics America, Inc.

Chapter 4: Circuit Design Taking Testability into Account
58
(5) Setting the test mode
h. Make sure the input buffers for the test-mode select input pins have their outputs
i. Make sure the output pins of the test-mode control circuit (KTCIR) are connected to the
j. Use the KTCIR’s output pin (MS) to control each macro when RAM and functional cells
k. Adjust the signals to the input/output buffer’s TA, TE, and TS pins, to ensure that their
a. DC test
connected to the input pins of the KTCIR.
Connect the INP0 input buffer’s output to the TM0 pin of the KTCIR.
Connect the INP1 input buffer’s output to the TM1 pin of the KTCIR.
Connect the INP2 input buffer’s output to the TM2 pin of the KTCIR.
input pins of the input/output buffers.
Connect the KTCIR’s output pin (TAC) to the TA pin of the AC test monitor output pin
(OUT3)’s input/output buffer.
Connect the KTCIR’s output pin (TS) to the TS pins of all input/output buffers.
Connect the KTCIR’s output pin (TD) to the TA pins of all input/output buffers, except for
the test monitor output pins (OUT3, OUT4).
Connect the KTCIR’s output pin (TE) to the TE pins of the input/output buffers of the tri-
state pin (OUT2) and bidirectional pin (BID1).
Connect the KTCIR’s output pin (OLG) to the TA pin of the DC test monitor output pin
(OUT4)’s input/output buffer.
are included.
fan-out limits will not be exceeded.
• Quiescent-current measurement mode
• Output-characteristic (V
• Input-characteristic (V
TSTEN
TSTEN
INP0
INP1
INP2
TSTEN
Measured pin *1
Unmeasured pin
*1: Apply to all input and bidirectional pins, except for TESTEN.
IH
. . .
. . .
. . .
. . .
. . .
. . .
. . .
. . .
OH
/V
IL
/V
) measurement mode
OL
) measurement mode
EPSON
High
High
Low
High/low input
Low
High
High/low input
High
STANDARD CELL S1K50000 SERIES
DESIGN GUIDE