EP2AGX65DF29C6N Altera, EP2AGX65DF29C6N Datasheet - Page 206

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EP2AGX65DF29C6N

Manufacturer Part Number
EP2AGX65DF29C6N
Description
IC ARRIA II GX FPGA 65K 780FBGA
Manufacturer
Altera
Series
Arria II GXr

Specifications of EP2AGX65DF29C6N

Number Of Logic Elements/cells
60214
Number Of Labs/clbs
2530
Total Ram Bits
5246
Number Of I /o
364
Voltage - Supply
0.87 V ~ 0.93 V
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 85°C
Package / Case
780-FBGA
Family Name
Arria® II GX
Number Of Logic Blocks/elements
63250
# I/os (max)
364
Frequency (max)
400MHz
Operating Supply Voltage (typ)
900mV
Logic Cells
63250
Ram Bits
5557452.8
Operating Supply Voltage (min)
0.87V
Operating Supply Voltage (max)
0.93V
Operating Temp Range
0C to 85C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
780
Package Type
FC-FBGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Number Of Gates
-
Lead Free Status / Rohs Status
Compliant

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8–22
Receiver Skew Margin for Non-DPA Mode
Arria II GX Device Handbook, Volume 1
Changes in system environment, such as temperature, media (cable, connector, or
PCB), and loading, effect the receiver ’s setup and hold times; internal skew affects the
sampling ability of the receiver.
Different modes of LVDS receivers use different specifications, which can help in
deciding the ability to sample the received serial data correctly. In DPA mode, use
DPA jitter tolerance instead of receiver skew margin (RSKM).
In non-DPA mode, use RSKM, transmitter channel-to-channel skew (TCCS), and
sampling window (SW) specifications for high-speed source-synchronous differential
signals in the receiver datapath. The relationship between RSKM, TCCS, and SW is
expressed by the RSKM equation shown in
Equation 8–1.
Where:
You must calculate the RSKM value to decide whether or not data can be sampled
properly by the LVDS receiver with the given data rate and device. A positive RSKM
value indicates the LVDS receiver can sample the data properly; a negative RSKM
indicates the receiver cannot sample the data properly.
Figure 8–20
Figure 8–20. Differential High-Speed Timing Diagram and Timing Budget for Non-DPA
For LVDS receivers, the Quartus II software provides the RSKM report showing SW,
TUI, and RSKM values for non-DPA mode. You can generate the RSKM by executing
the report_RSKM command in the TimeQuest Timing Analyzer. You can find the
RSKM report in the Quartus II Compilation report under TimeQuest Timing
Analyzer section.
TUI—the time period of the serial data.
RSKM—the timing margin between the receiver’s clock input and the data input
SW.
SW—the period of time that the input data must be stable to ensure that data is
successfully sampled by the LVDS receiver. The sampling window is device
property and varies with device speed grade.
TCCS—the difference between the fastest and slowest data output transitions,
including the t
shows the relationship between the RSKM, TCCS, and SW.
Internal Clock
Input Clock
Input Data
Receiver
External
CO
variation and clock skew.
Chapter 8: High-Speed Differential I/O Interfaces and DPA in Arria II GX Devices
TCCS
RSKM = (TUI - SW - TCCS)/2
RSKM
Time Unit Interval (TUI)
Sampling Window (SW)
Equation
8–1:
RSKM
Source-Synchronous Timing Budget
© July 2010 Altera Corporation
TCCS

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