EP2AGX65DF29C6N Altera, EP2AGX65DF29C6N Datasheet - Page 300

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EP2AGX65DF29C6N

Manufacturer Part Number
EP2AGX65DF29C6N
Description
IC ARRIA II GX FPGA 65K 780FBGA
Manufacturer
Altera
Series
Arria II GXr

Specifications of EP2AGX65DF29C6N

Number Of Logic Elements/cells
60214
Number Of Labs/clbs
2530
Total Ram Bits
5246
Number Of I /o
364
Voltage - Supply
0.87 V ~ 0.93 V
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 85°C
Package / Case
780-FBGA
Family Name
Arria® II GX
Number Of Logic Blocks/elements
63250
# I/os (max)
364
Frequency (max)
400MHz
Operating Supply Voltage (typ)
900mV
Logic Cells
63250
Ram Bits
5557452.8
Operating Supply Voltage (min)
0.87V
Operating Supply Voltage (max)
0.93V
Operating Temp Range
0C to 85C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
780
Package Type
FC-FBGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Number Of Gates
-
Lead Free Status / Rohs Status
Compliant

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11–6
Boundary-Scan Description Language Support
Revision History
Table 11–4. Document Revision History
Arria II GX Device Handbook, Volume 1
July 2010
November 2009
February 2009
Date
f
f
The boundary-scan description language (BSDL), a subset of VHDL, provides a
syntax that allows you to describe the features of an IEEE Std. 1149.6 BST-capable
device that can be tested. You can test software development systems, then use the
BSDL files for test generation, analysis, and failure diagnostics.
For more information about BSDL files for IEEE Std. 1149.6-compliant Arria II GX
devices, refer to the
You can also generate BSDL files (pre-configuration and post-configuration) for
IEEE Std. 1149.6-compliant Arria II GX devices with the Quartus
version 9.1 and later. For the procedure to generate BSDL files using the Quartus II
software, refer to
Table 11–4
Version
3.0
2.0
1.0
lists the revision history for this chapter.
Updated for Arria II GX v10.0 release:
Updated for Arria II GX v9.1 release:
Initial release.
Updated
Minor text edits.
Updated Table 11–1 and Table 11–2.
Updated “I/O Voltage Support in a JTAG Chain” section.
Minor text edits.
BSDL Files Generation in
IEEE 1149.6 BSDL Files
“BST Operation Control”
Changes Made
section.
QII.
page on the Altera
Boundary-Scan Description Language Support
Chapter 11: JTAG Boundary-Scan Testing
© July 2010 Altera Corporation
®
website.
®
II software

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