ds3104-se Maxim Integrated Products, Inc., ds3104-se Datasheet - Page 120
ds3104-se
Manufacturer Part Number
ds3104-se
Description
Line Card Timing Ic With Synchronous Ethernet Support
Manufacturer
Maxim Integrated Products, Inc.
Datasheet
1.DS3104-SE.pdf
(135 pages)
- Current page: 120 of 135
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________________________________________________________________________________________ DS3104-SE
9.4
JTAG Test Registers
IEEE 1149.1 requires a minimum of two test registers—the bypass register and the boundary scan register. An
optional test register, the identification register, has been included in the device design. It is used with the IDCODE
instruction and the Test-Logic-Reset state of the TAP controller.
Bypass Register. This is a single 1-bit shift register used with the BYPASS, CLAMP, and HIGHZ instructions to
provide a short path between JTDI and JTDO.
Boundary Scan Register. This register contains a shift register path and a latched parallel output for control cells
and digital I/O cells. BSDL files are available at www.maxim-ic.com/TechSupport/telecom/bsdl.htm.
Identification Register. This register contains a 32-bit shift register and a 32-bit latched parallel output. It is
selected during the IDCODE instruction and when the TAP controller is in the Test-Logic-Reset state. The device
identification code for the DS3104-SE is shown in Table 9-2.
Table 9-2. JTAG ID Code
DEVICE
REVISION
DEVICE CODE
MANUFACTURER CODE
REQUIRED
DS3104-SE
Consult factory
0000000010100010
00010100001
1
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