se97b NXP Semiconductors, se97b Datasheet - Page 25

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se97b

Manufacturer Part Number
se97b
Description
Ddr Memory Module Temp Sensor With Integrated Spd
Manufacturer
NXP Semiconductors
Datasheet

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NXP Semiconductors
SE97B_1
Product data sheet
Table 13.
Bit
8
7
6
5
4
Symbol
SHMD
CTLB
AWLB
CEVNT
ESTAT
Configuration register (address 01h) bit description
Description
Shutdown Mode.
When shut down, the thermal sensor diode and ADC are disabled to save
power, no events will be generated. When either of the Critical Trip or Alarm
Window lock bits is set, this bit cannot be set until unlocked. However, it can
be cleared at any time. When in shutdown mode, the SE97B will still respond
to commands normally.
When coming out of shutdown, the EVENT output remains de-asserted as a
new temperature conversion is done. Hysteresis is subtracted from the alarm
thresholds if the temperature is falling but not used if the temperature is
rising. The temperature trend will not be determined until at least two
temperature conversions are done. Since all the alarm threshold flags
(TEMP bits 13, 14, 15) are cleared with coming out of shutdown, it was
decided to only apply hysteresis to the lower alarm threshold calculations
when determining after the initial temperature conversion if the EVENT
should assert. After the second temperature conversion the direction of
temperature is known and TEMP bits 13, 14 or 15 are changed as required
and the EVENT is asserted as required.
Critical Trip Lock bit.
This bit is initially cleared. When set, this bit will return a ‘1’, and remains
locked until cleared by internal Power-on reset. This bit can be written with a
single write and does not require double writes.
Alarm Window Lock bit.
This bit is initially cleared. When set, this bit will return a ‘1’ and remains
locked until cleared by internal power-on reset. This bit can be written with a
single write and does not require double writes.
Clear EVENT (write only).
If SMBUS[0] is a logic 0, the SMBus Alert Response Address (ARA)
command can be sent to also clear the EVENT output. When read, this
register always returns zero.
EVENT Status (read only).
The actual event causing the event can be determined from the Read
Temperature register. Interrupt Events can be cleared by writing to the ‘Clear
EVENT’ bit (CEVNT) or SMBus Alert Response. Writing to this bit will have
no effect.
0 — Temperature Sensor is active and converting (default).
1 — disabled Temperature Sensor will not generate interrupts or update
the temperature data.
0 — Critical Alarm Trip register is not locked and can be altered (default)
1 — Critical Alarm Trip register settings cannot be altered
0 — Upper and Lower Alarm Trip registers are not locked and can be
altered (default)
1 — Upper and Lower Alarm Trip registers setting cannot be altered
0 — no effect (default)
1 — clears active EVENT in Interrupt mode. Writing to this register has no
effect in Comparator mode.
0 — EVENT output condition is not being asserted by this device (default)
1 — EVENT output pin is being asserted by this device due to Alarm
Window or Critical Trip condition
Rev. 01 — 27 January 2010
DDR memory module temp sensor with integrated SPD
…continued
© NXP B.V. 2010. All rights reserved.
SE97B
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