AGL015 MICROSEMI [Microsemi Corporation], AGL015 Datasheet - Page 56

• Manufacturer Part Number: AGL015
• Description: IGLOO Low Power Flash FPGAs with Flash*Freeze Technology
• Manufacturer: MICROSEMI [Microsemi Corporation]

IGLOO DC and Switching Characteristics
2- 40
Table 2-44 • I/O Short Currents IOSH/IOSL
The length of time an I/O can withstand I
reliability data below is based on a 3.3 V, 12 mA I/O setting, which is the worst case for this type of
analysis.
For example, at 100°C, the short current condition would have to be sustained for more than six months
to cause a reliability concern. The I/O design does not contain any short circuit protection, but such
protection would only be needed in extremely prolonged stress conditions.
Table 2-45 • Duration of Short Circuit Event before Failure
Table 2-46 • I/O Input Rise Time, Fall Time, and Related I/O Reliability
3.3 V LVTTL / 3.3 V LVCMOS
3.3 V LVCMOS Wide Range
2.5 V LVCMOS
1.8 V LVCMOS
1.5 V LVCMOS
1.2 V LVCMOS
1.2 V LVCMOS Wide Range
Note:
Temperature
–40°C
–20°C
0°C
25°C
70°C
85°C
100°C
Input Buffer
LVTTL/LVCMOS
LVDS/B-LVDS/M-LVDS/
LVPECL
Note:
*T
The maximum input rise/fall time is related to the noise induced into the input buffer trace. If the
noise is low, then the rise time and fall time of input buffers can be increased beyond the
maximum value. The longer the rise/fall times, the more susceptible the input signal is to the
board noise. Microsemi recommends signal integrity evaluation/characterization of the system to
ensure that there is no excessive noise coupling into input signals.
J
= 100°C
Applicable to Standard I/O Banks
Input Rise/Fall Time
No requirement
No requirement
(min.)
Drive Strength
OSH
R ev i sio n 1 9
100 μA
100 μA
/I
2 mA
4 mA
6 mA
8 mA
2 mA
4 mA
6 mA
8 mA
2 mA
4 mA
2 mA
1 mA
OSL
events depends on the junction temperature. The
Input Rise/Fall Time
10 ns *
10 ns *
(max.)
Time before Failure
IOSL (mA)*
TBD
TBD
TBD
> 20 years
> 20 years
> 20 years
> 20 years
25
25
51
51
16
16
32
32
17
13
6 months
9
5 years
2 years
20 years (100°C)
10 years (100°C)
Reliability
IOSH (mA)*
TBD
TBD
TBD
27
27
54
54
18
18
37
37
11
22
16