MC9S08AW60CPUE Freescale Semiconductor, MC9S08AW60CPUE Datasheet - Page 308

• Manufacturer Part Number: MC9S08AW60CPUE
• Description: IC MCU 64K FLASH 64-LQFP
• Manufacturer: Freescale Semiconductor
• Series: HCS08r

Specifications of MC9S08AW60CPUE

• Core Processor: HCS08
• Core Size: 8-Bit
• Speed: 40MHz
• Connectivity: I²C, SCI, SPI
• Peripherals: LVD, POR, PWM, WDT
• Number Of I /o: 54
• Program Memory Size: 60KB (60K x 8)
• Program Memory Type: FLASH
• Ram Size: 2K x 8
• Voltage - Supply (vcc/vdd): 2.7 V ~ 5.5 V
• Data Converters: A/D 16x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 64-LQFP
• Processor Series: S08AW
• Core: HCS08
• Data Bus Width: 8 bit
• Data Ram Size: 2 KB
• Interface Type: SCI/SPI
• Maximum Clock Frequency: 40 MHz
• Number Of Programmable I/os: 54
• Number Of Timers: 8
• Operating Supply Voltage: - 0.3 V to + 5.8 V
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: EWS08
• Development Tools By Supplier: DEMO9S08AW60E
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 16-ch x 10-bit
• For Use With: DEMO9S08AW60E - DEMO BOARD FOR MC9S08AW60
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

Appendix A Electrical Characteristics and Timing Specifications
The conducted susceptibility is determined by injecting the transient susceptibility signal on each pin of
the microcontroller. The transient waveform and injection methodology is based on IEC 61000-4-4
(EFT/B). The transient voltage required to cause performance degradation on any pin in the tested
configuration is greater than or equal to the reported levels unless otherwise indicated by footnotes below
the table.
1
2
The susceptibility performance classification is described in
308
Data based on qualification test results. Not tested in production.
The RESET pin is susceptible to the minimum applied transient of 220 V. All other pins have a result of A up to a minimum of
2000V.
Conducted susceptibility, electrical
Result
fast transient/burst (EFT/B)
A
B
C
D
E
Parameter
Self-recovering
Hard failure
Soft failure
No failure
Damage
failure
Table A-19. Susceptibility Performance Classification
The MCU performs as designed during and after exposure.
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.
Table A-18. Conducted Susceptibility
V
Symbol
CS_EFT
MC9S08AW60 Data Sheet, Rev 2
package type
Conditions
V
T
A
DD
64 QFP
= +25
= 5.5V
Performance Criteria
o
C
Table
2 MHz Bus
f
32768 Hz
OSC
crystal
/f
A-19.
BUS
Result
A
B
C
D
Freescale Semiconductor
Amplitude
±2.0
>±3.0
(Min)
±2.5
±3.0
±0
2
1
Unit
kV